{"title":"带有对称逆变器和相邻单元的母线槽PUF的标准单元实现,用于通过随机性测试","authors":"Y. Ogasahara, Y. Hori, H. Koike","doi":"10.1109/GCCE.2015.7398553","DOIUrl":null,"url":null,"abstract":"In this paper, from the measurement results on silicon, we validate that symmetric inverters placement including neighboring cells of buskeeper PUF achieves not only fine uniqueness but also sufficient randomness which was not presented in past works. We also demonstrate that our symmetric implementation enables fine PUF performance regardless of pMOS and nMOS width of inverters in foundry-dependent standard cell libraries. Our measurement results of 65280 bit buskeeper PUFs with suggested design on silicon passed 10 randomness tests, and achieved 2.118% within-class HD, μ=0.5001 and σ=0.0359 class-to-class HD, and 0.9992 entropy/bit.","PeriodicalId":363743,"journal":{"name":"2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)","volume":"125 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Standard cell implementation of buskeeper PUF with symmetric inverters and neighboring cells for passing randomness tests\",\"authors\":\"Y. Ogasahara, Y. Hori, H. Koike\",\"doi\":\"10.1109/GCCE.2015.7398553\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, from the measurement results on silicon, we validate that symmetric inverters placement including neighboring cells of buskeeper PUF achieves not only fine uniqueness but also sufficient randomness which was not presented in past works. We also demonstrate that our symmetric implementation enables fine PUF performance regardless of pMOS and nMOS width of inverters in foundry-dependent standard cell libraries. Our measurement results of 65280 bit buskeeper PUFs with suggested design on silicon passed 10 randomness tests, and achieved 2.118% within-class HD, μ=0.5001 and σ=0.0359 class-to-class HD, and 0.9992 entropy/bit.\",\"PeriodicalId\":363743,\"journal\":{\"name\":\"2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)\",\"volume\":\"125 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GCCE.2015.7398553\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GCCE.2015.7398553","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Standard cell implementation of buskeeper PUF with symmetric inverters and neighboring cells for passing randomness tests
In this paper, from the measurement results on silicon, we validate that symmetric inverters placement including neighboring cells of buskeeper PUF achieves not only fine uniqueness but also sufficient randomness which was not presented in past works. We also demonstrate that our symmetric implementation enables fine PUF performance regardless of pMOS and nMOS width of inverters in foundry-dependent standard cell libraries. Our measurement results of 65280 bit buskeeper PUFs with suggested design on silicon passed 10 randomness tests, and achieved 2.118% within-class HD, μ=0.5001 and σ=0.0359 class-to-class HD, and 0.9992 entropy/bit.