具有增强读写电压裕度的低漏9-CN-MOSFET SRAM单元

Yanan Sun, Hailong Jiao, V. Kursun
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引用次数: 1

摘要

提出了一种由9个碳纳米管mosfet (9- cn - mosfet)组成的新型静态随机存取存储器(SRAM)单元。使用新的9-CN-MOSFET SRAM单元,读取数据稳定性提高了99.09%,同时与传统的六晶体管(6T) SRAM单元在16nm碳纳米管晶体管技术中提供相似的读取速度。与传统的6T SRAM单元相比,所提出的9-CN-MOSFET SRAM单元的最坏情况写入电压裕度增加了4.57倍。此外,在空闲模式下,与具有6T SRAM单元的存储阵列相比,具有新存储单元的1Kibit SRAM阵列的泄漏功率降低了34.18%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low-leakage 9-CN-MOSFET SRAM cell with enhanced read and write voltage margins
A novel static random-access memory (SRAM) cell with nine carbon nanotube MOSFETs (9-CN-MOSFETs) is proposed in this paper. With the new 9-CN-MOSFET SRAM cell, the read data stability is enhanced by 99.09% while providing similar read speed as compared to the conventional six-transistor (6T) SRAM cell in a 16nm carbon nanotube transistor technology. The worst-case write voltage margin is increased by 4.57x with the proposed 9-CN-MOSFET SRAM cell as compared to the conventional 6T SRAM cell. Furthermore, a 1Kibit SRAM array with the new memory cells consumes 34.18% lower leakage power as compared to the memory array with 6T SRAM cells in idle mode.
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