{"title":"具有增强读写电压裕度的低漏9-CN-MOSFET SRAM单元","authors":"Yanan Sun, Hailong Jiao, V. Kursun","doi":"10.1109/ICM.2014.7071832","DOIUrl":null,"url":null,"abstract":"A novel static random-access memory (SRAM) cell with nine carbon nanotube MOSFETs (9-CN-MOSFETs) is proposed in this paper. With the new 9-CN-MOSFET SRAM cell, the read data stability is enhanced by 99.09% while providing similar read speed as compared to the conventional six-transistor (6T) SRAM cell in a 16nm carbon nanotube transistor technology. The worst-case write voltage margin is increased by 4.57x with the proposed 9-CN-MOSFET SRAM cell as compared to the conventional 6T SRAM cell. Furthermore, a 1Kibit SRAM array with the new memory cells consumes 34.18% lower leakage power as compared to the memory array with 6T SRAM cells in idle mode.","PeriodicalId":107354,"journal":{"name":"2014 26th International Conference on Microelectronics (ICM)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Low-leakage 9-CN-MOSFET SRAM cell with enhanced read and write voltage margins\",\"authors\":\"Yanan Sun, Hailong Jiao, V. Kursun\",\"doi\":\"10.1109/ICM.2014.7071832\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel static random-access memory (SRAM) cell with nine carbon nanotube MOSFETs (9-CN-MOSFETs) is proposed in this paper. With the new 9-CN-MOSFET SRAM cell, the read data stability is enhanced by 99.09% while providing similar read speed as compared to the conventional six-transistor (6T) SRAM cell in a 16nm carbon nanotube transistor technology. The worst-case write voltage margin is increased by 4.57x with the proposed 9-CN-MOSFET SRAM cell as compared to the conventional 6T SRAM cell. Furthermore, a 1Kibit SRAM array with the new memory cells consumes 34.18% lower leakage power as compared to the memory array with 6T SRAM cells in idle mode.\",\"PeriodicalId\":107354,\"journal\":{\"name\":\"2014 26th International Conference on Microelectronics (ICM)\",\"volume\":\"57 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 26th International Conference on Microelectronics (ICM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICM.2014.7071832\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 26th International Conference on Microelectronics (ICM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2014.7071832","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Low-leakage 9-CN-MOSFET SRAM cell with enhanced read and write voltage margins
A novel static random-access memory (SRAM) cell with nine carbon nanotube MOSFETs (9-CN-MOSFETs) is proposed in this paper. With the new 9-CN-MOSFET SRAM cell, the read data stability is enhanced by 99.09% while providing similar read speed as compared to the conventional six-transistor (6T) SRAM cell in a 16nm carbon nanotube transistor technology. The worst-case write voltage margin is increased by 4.57x with the proposed 9-CN-MOSFET SRAM cell as compared to the conventional 6T SRAM cell. Furthermore, a 1Kibit SRAM array with the new memory cells consumes 34.18% lower leakage power as compared to the memory array with 6T SRAM cells in idle mode.