{"title":"漏电流和短路电流对功率门控域涌流分析的影响","authors":"V. Sreekumar, S. Ravichandran","doi":"10.1109/SECON.2010.5453925","DOIUrl":null,"url":null,"abstract":"Power shut off being a key technique for power reduction in today's designs, it is critical to be able to verify circuit behavior when it is powered from an off state to an on state. The total rush current and turn-on time of the module can be impacted by the high short circuit current caused by slow signal slew rates and the leakage current of the module. In this paper, we present a study on how these effects impact the overall analysis and how they can be accounted for during a power-up analysis. The analysis has been done on ARM 968 processor based Wireless LAN IC.","PeriodicalId":286940,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Impact of leakage and short circuit current in rush current analysis of power gated domains\",\"authors\":\"V. Sreekumar, S. Ravichandran\",\"doi\":\"10.1109/SECON.2010.5453925\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Power shut off being a key technique for power reduction in today's designs, it is critical to be able to verify circuit behavior when it is powered from an off state to an on state. The total rush current and turn-on time of the module can be impacted by the high short circuit current caused by slow signal slew rates and the leakage current of the module. In this paper, we present a study on how these effects impact the overall analysis and how they can be accounted for during a power-up analysis. The analysis has been done on ARM 968 processor based Wireless LAN IC.\",\"PeriodicalId\":286940,\"journal\":{\"name\":\"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-03-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SECON.2010.5453925\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SECON.2010.5453925","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Impact of leakage and short circuit current in rush current analysis of power gated domains
Power shut off being a key technique for power reduction in today's designs, it is critical to be able to verify circuit behavior when it is powered from an off state to an on state. The total rush current and turn-on time of the module can be impacted by the high short circuit current caused by slow signal slew rates and the leakage current of the module. In this paper, we present a study on how these effects impact the overall analysis and how they can be accounted for during a power-up analysis. The analysis has been done on ARM 968 processor based Wireless LAN IC.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
