印制电路板上布置去耦电容时回路面积迹线辐射发射分析

M. Montrose
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引用次数: 10

摘要

本文给出了一个坚实的结论,为工程师提供了实用的、实际操作的EMC信息,这些信息可以在不依赖麦克斯韦方程组的数学的情况下立即使用。当与实际的高速元件一起使用时,进行检查以确定去耦电容器的物理位置是否对印刷电路板(PCB)的辐射发射的发展和传播产生重大影响。重点是在PCB的顶层和底层发生的事情,无论电路板是单面,双面还是多层。本文对利用仿真研究解耦的现有研究进行了补充。本文支持仿真结果与实际结果的相关性。仿真的一个问题是,计算结果有时不能考虑在最大容性负载下切换多个输出的元件所产生的共模射频能量,这些共模射频能量由于切换交叉传导而消耗大量的涌流或脉冲电流。在这个时候,共模能量不能总是有效地模拟,从而导致对PCB布局的预期辐射发射的不准确假设的可能性。用于仿真的行为模型通常(理论上)是完美的,由于寄生和其他不容易计算或预测的电磁效应,可能不能代表实际的设计参数。射频能量是由数字元件切换逻辑状态而产生的。元件之间的电源和地平面上的电压梯度导致在互连和其他辐射结构上观察到共模EMI。去耦电容器可将电压梯度降至最低,同时将注入配电网络和分布在整个PCB中的射频开关能量降至最低。本文根据去耦电容与数字元件的物理位置,研究了与去耦电容有关的辐射能量大小。此外,从时域和频域分析两方面介绍了确定最佳去耦电容值的常见工程问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Analysis on loop area trace radiated emissions from decoupling capacitor placement on printed circuit boards
This paper presents, with a solid conclusion, practical, hands-on applied EMC information for engineers that can be put to immediate use without relying on the mathematics of Maxwell's equations. An examination is made to determine if the physical placement of decoupling capacitors makes a significant difference in the development and propagation of radiated emissions from a printed circuit board (PCB) when used with actual, high-speed components. The focus is on what happens on both the top and bottom layers of a PCB, regardless of whether the board is single-sided, double-sided or multilayer. This paper complements existing research that investigates decoupling using simulation. Correlation between simulation and actual results is supported in this paper. A problem with simulation is that results calculated sometimes cannot take into consideration common-mode RF energy developed by components switching multiple outputs under maximum capacitive load, consuming a large amount of inrush current or impulse currents from switching cross-conduction. Common-mode energy cannot always be efficiently simulated at this time, thus causing the possibility of inaccurate assumptions regarding anticipated radiated emissions from a PCB layout. Behavioral models used for simulation are usually (theoretically) perfect and may not represent actual design parameters due to parasitics and other electromagnetic effects that cannot be easily calculated or anticipated. RF energy is developed due to digital components switching logic states. A voltage gradient on the power and ground planes between components causes common-mode EMI to be observed on interconnects and other radiating structures. Decoupling capacitors are provided to minimize voltage gradients, along with minimizing RF switching energy injected into the power distribution network and distributed throughout the entire PCB. The magnitude of radiated energy, related to decoupling capacitors is investigated in this paper, based on the physical location to digital components. In addition, common engineering problems in determining an optimal decoupling capacitor value are presented, with regard to both time and frequency domain analysis.
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