CTRON FTAM-CCL和cmi - ccl接口的可移植性研究

M. Wakano, N. Sugiyama
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引用次数: 4

摘要

CTRON技术委员会已经计划了几次CTRON可移植性评估测试。CTRON可移植性实验第2步集中在第3层、第4/5层、FTAM和CMISE。作者给出了FTAM和CMISE测试的概述。通过检查将FTAM和CMISE接口从原来的CTRON基本操作系统移植到另一个CTRON基本操作系统所需的问题、时间和源代码修改来评估FTAM和CMISE接口的可移植性。结果表明,FTAM和CMISE协议部分具有较高的可移植性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A study on the portability of CTRON FTAM-CCL and CMISE-CCL interfaces
The CTRON technical committee has planned serveral CTRON portability evaluation tests. The CTRON portability experiment step 2 concentrates on layer 3, layers 4/5, FTAM, and CMISE. The authors give an overview of FTAM and CMISE tests. The portability of FTAM and CMISE interfaces is evaluated by examining problems, time taken, and source code modification required for porting them from their original CTRON basic operating systems to another CTRON basic operating system. The results confirm that the protocol parts of FTAM and CMISE have high portability.<>
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