最小的硬件多重签名分析的BIST

Yuejian Wu, A. Ivanov
{"title":"最小的硬件多重签名分析的BIST","authors":"Yuejian Wu, A. Ivanov","doi":"10.1109/VTEST.1993.313314","DOIUrl":null,"url":null,"abstract":"Proposes a new BIST multiple intermediate signature analysis scheme which checks n signatures against a single reference. Therefore, the circuitry for checking n signatures is essentially the same as that for checking one signature. The scheme is based on a manipulation of the CUT's fault-free output sequence. No circuit modification is required. The cost for implementing the scheme is a small nonrecurring CPU time expenditure in the design phase. In return, the scheme yields significant recurring silicon area savings, and reduced aliasing.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Minimal hardware multiple signature analysis for BIST\",\"authors\":\"Yuejian Wu, A. Ivanov\",\"doi\":\"10.1109/VTEST.1993.313314\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Proposes a new BIST multiple intermediate signature analysis scheme which checks n signatures against a single reference. Therefore, the circuitry for checking n signatures is essentially the same as that for checking one signature. The scheme is based on a manipulation of the CUT's fault-free output sequence. No circuit modification is required. The cost for implementing the scheme is a small nonrecurring CPU time expenditure in the design phase. In return, the scheme yields significant recurring silicon area savings, and reduced aliasing.<<ETX>>\",\"PeriodicalId\":283218,\"journal\":{\"name\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-04-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1993.313314\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313314","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

提出了一种针对单个引用检查n个签名的BIST多重中间签名分析方案。因此,检查n个签名的电路与检查一个签名的电路本质上是一样的。该方案基于对CUT的无故障输出序列的操作。不需要修改电路。在设计阶段,实现该方案的成本是很少的非经常性CPU时间支出。作为回报,该方案产生了显著的循环硅面积节省,并减少了混叠。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Minimal hardware multiple signature analysis for BIST
Proposes a new BIST multiple intermediate signature analysis scheme which checks n signatures against a single reference. Therefore, the circuitry for checking n signatures is essentially the same as that for checking one signature. The scheme is based on a manipulation of the CUT's fault-free output sequence. No circuit modification is required. The cost for implementing the scheme is a small nonrecurring CPU time expenditure in the design phase. In return, the scheme yields significant recurring silicon area savings, and reduced aliasing.<>
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