从有限数据集推断设备电磁磁化率的概率分布

T. Houret, Philippe Besnier, S. Vauchamp, Philippe Pouliguen
{"title":"从有限数据集推断设备电磁磁化率的概率分布","authors":"T. Houret, Philippe Besnier, S. Vauchamp, Philippe Pouliguen","doi":"10.1109/EMCEUROPE.2018.8485108","DOIUrl":null,"url":null,"abstract":"Failure risk assessment of electronic equipment to an electromagnetic aggression is the cornerstone of Intentional Electromagnetic Interference (IEMI). Such a failure may occur if the electromagnetic constraint reaches a threshold that is likely to produce a dysfunction. Due to the production variability of electric / electronic equipment under analysis, its susceptibility level may be considered as a random variable. Estimation of its distribution through susceptibility measurements of a limited set of available equipment is required. We compare the performance of the Bayesian Inference (BI) and the Maximum Likelihood Inference (MLI) according to their ability to choose the true distribution for different sample size, when the true distribution is theoretically known. Then we compare the performance of the BI and the MLI on a virtual electronic device for which the true distribution is not known a priori. We finally discuss the respective benefits of BI and MLI in estimating the failure probability of equipment.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Inferring the Probability Distribution of the Electromagnetic Susceptibility of Equipment from a Limited Set of Data\",\"authors\":\"T. Houret, Philippe Besnier, S. Vauchamp, Philippe Pouliguen\",\"doi\":\"10.1109/EMCEUROPE.2018.8485108\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Failure risk assessment of electronic equipment to an electromagnetic aggression is the cornerstone of Intentional Electromagnetic Interference (IEMI). Such a failure may occur if the electromagnetic constraint reaches a threshold that is likely to produce a dysfunction. Due to the production variability of electric / electronic equipment under analysis, its susceptibility level may be considered as a random variable. Estimation of its distribution through susceptibility measurements of a limited set of available equipment is required. We compare the performance of the Bayesian Inference (BI) and the Maximum Likelihood Inference (MLI) according to their ability to choose the true distribution for different sample size, when the true distribution is theoretically known. Then we compare the performance of the BI and the MLI on a virtual electronic device for which the true distribution is not known a priori. We finally discuss the respective benefits of BI and MLI in estimating the failure probability of equipment.\",\"PeriodicalId\":376960,\"journal\":{\"name\":\"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCEUROPE.2018.8485108\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE.2018.8485108","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

电子设备对电磁攻击的失效风险评估是故意电磁干扰(IEMI)的基础。如果电磁约束达到可能产生功能障碍的阈值,则可能发生这种故障。由于所分析的电气/电子设备的生产变异性,其易感性水平可视为随机变量。需要通过对一组有限的可用设备的敏感性测量来估计其分布。我们比较了贝叶斯推理(BI)和最大似然推理(MLI)的性能,根据它们选择不同样本量的真实分布的能力,当真实分布在理论上是已知的。然后,我们比较了BI和MLI在一个真实分布未知的虚拟电子设备上的性能。最后讨论了BI和MLI在估计设备故障概率方面的各自优势。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Inferring the Probability Distribution of the Electromagnetic Susceptibility of Equipment from a Limited Set of Data
Failure risk assessment of electronic equipment to an electromagnetic aggression is the cornerstone of Intentional Electromagnetic Interference (IEMI). Such a failure may occur if the electromagnetic constraint reaches a threshold that is likely to produce a dysfunction. Due to the production variability of electric / electronic equipment under analysis, its susceptibility level may be considered as a random variable. Estimation of its distribution through susceptibility measurements of a limited set of available equipment is required. We compare the performance of the Bayesian Inference (BI) and the Maximum Likelihood Inference (MLI) according to their ability to choose the true distribution for different sample size, when the true distribution is theoretically known. Then we compare the performance of the BI and the MLI on a virtual electronic device for which the true distribution is not known a priori. We finally discuss the respective benefits of BI and MLI in estimating the failure probability of equipment.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信