智能手机设计中屏蔽罐引起的CSE问题研究

Ji Haiying, Gao You-gang, Zhang Dan, Wang Chen
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引用次数: 0

摘要

本文首先对智能手机设计中屏蔽天线引起的传导杂散发射问题进行了实验分析,并找到了可行的解决方案。然后,将智能手机中受屏蔽影响的电路元件分为元器件和微带线两类。最后,通过CST仿真的方法,进一步研究了屏蔽罐顶面和壁面对微带线阻抗的影响,并给出了避免屏蔽罐影响的微带线设计准则。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Study on the CSE problem induced by shielding can during smart mobile phone design
In this Paper firstly, the CSE (Conducted Spurious Emission) problem induced by shielding can in smart mobile phone design is experimentally analyzed, and the feasible solution is found. Then, the elements of circuits, which can be influenced by shielding can in smart mobile phone are classified into two categories, and they are the components and the micro-strip line. At last, by method of CST simulation the influence from shielding can's top face and wall to impedance of micro-strip line is further studied, and the guidelines for micro-strip line design to avoid shielding can's influence are also given.
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