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热成像显微镜:在微电子器件诊断中的应用

2009 International School and Seminar on Modern Problems of Nanoelectronics, Micro- and Nanosystem Technologies Pub Date : 2009-11-13 DOI:10.1109/INTERNANO.2009.5335612
G. L. Kuryshev
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引用次数: 0

摘要

热成像显微镜具有广泛的科学技术应用前景
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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Thermal imaging microscopy: Application for diagnostics the microelectronic devices
Thermal imaging microscopy have wide possibilities for scientific and technical applications
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2009 International School and Seminar on Modern Problems of Nanoelectronics, Micro- and Nanosystem Technologies
2009 International School and Seminar on Modern Problems of Nanoelectronics, Micro- and Nanosystem Technologies
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