二氧化硅微通道中增强的水蒸气流动和阳极氧化铝(AAO)膜间扩散的水蒸气流动

Wenwen Lei, D. Mckenzie
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引用次数: 0

摘要

增强的液态水通过碳纳米管流动,重新激活了通过膜和微纳米通道的水分渗透研究。尽管水蒸气在工业中,特别是在电子设备的封装中,与液态水一样重要,但通过微和纳米通道对水蒸气的研究一直被忽视。本文首次测量了二氧化硅微通道中的水分流动速率和阳极氧化铝(AAO)膜通道中扩散的水蒸气流动。我们通过四种先前定义的标准配置构建了主要水运模式的流速理论,并将其与我们的新测量结果进行了比较。研究结果表明,使用其他分子(如氦)来测量泄漏行为是不可靠的。氦气测量高估了单相水蒸气流,而当边界滑移发生时,低估了Washburn或毛细管流或所有通道的流动,其程度取决于液相流动的滑移长度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Enhanced water vapour flow in silica microchannels and interdiffusive water vapour flow through anodic aluminium oxide (AAO) membranes
Enhanced liquid water flows through carbon nanotubes reinvigorated the study of moisture permeation through membranes and micro- and nano-channels. The study of water vapour through micro-and nano-channels has been neglected even though water vapour is as important as liquid water for industry, especially for encapsulation of electronic devices. Here we measure moisture flow rates in silica microchannels and interdiffusive water vapour flows in anodic aluminium oxide (AAO) membrane channels for the first time. We construct theory for the flow rates of the dominant modes of water transport through four previously defined standard configurations and benchmark it against our new measurements. The findings show that measurements of leak behaviour made using other molecules, such as helium, are not reliable. Single phase water vapour flow is overestimated by a helium measurement, while Washburn or capillary flow is underestimated or for all channels when boundary slip applies, to an extent that depends on the slip length for the liquid phase flows.
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