冗余传感器高可诊断性的错误检测与屏蔽电路

Beatrice Shokry, H. Amer, R. Daoud, Mahmoud Rumman, A. S. Emara
{"title":"冗余传感器高可诊断性的错误检测与屏蔽电路","authors":"Beatrice Shokry, H. Amer, R. Daoud, Mahmoud Rumman, A. S. Emara","doi":"10.1109/MECO58584.2023.10155013","DOIUrl":null,"url":null,"abstract":"Sensors are essential components in factory automation. Their reliability can be increased by using fault-tolerant architectures such as Triple Modular Redundancy (TMR). Furthermore, error detection and diagnosis can significantly reduce downtime. This paper first proposes an Analog Error Detection and Masking (AEDM) circuit that produces a correct analog reading as long as at least two of the three analog sensors are operational even if the readings are not identical. This circuit operates in the analog domain. It is then combined with a Digital Error Detection and Masking (DEDM) circuit from the literature, and it is proven that the combined mechanism can detect up to one failure while identifying the failure type (sensor failure or Analog to Digital converter (ADC) failure). This mechanism is then slightly adapted by adding two multiplexers to detect up to two failures simultaneously (one sensor and one ADC). Both mechanisms can propagate a correct output to the rest of the system while also identifying the erroneous modules for easier diagnosis and less repair time. The AEDM was successfully simulated on ELDO.","PeriodicalId":187825,"journal":{"name":"2023 12th Mediterranean Conference on Embedded Computing (MECO)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Error Detection and Masking Circuit with High Diagnosability for Redundant Sensors\",\"authors\":\"Beatrice Shokry, H. Amer, R. Daoud, Mahmoud Rumman, A. S. Emara\",\"doi\":\"10.1109/MECO58584.2023.10155013\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Sensors are essential components in factory automation. Their reliability can be increased by using fault-tolerant architectures such as Triple Modular Redundancy (TMR). Furthermore, error detection and diagnosis can significantly reduce downtime. This paper first proposes an Analog Error Detection and Masking (AEDM) circuit that produces a correct analog reading as long as at least two of the three analog sensors are operational even if the readings are not identical. This circuit operates in the analog domain. It is then combined with a Digital Error Detection and Masking (DEDM) circuit from the literature, and it is proven that the combined mechanism can detect up to one failure while identifying the failure type (sensor failure or Analog to Digital converter (ADC) failure). This mechanism is then slightly adapted by adding two multiplexers to detect up to two failures simultaneously (one sensor and one ADC). Both mechanisms can propagate a correct output to the rest of the system while also identifying the erroneous modules for easier diagnosis and less repair time. The AEDM was successfully simulated on ELDO.\",\"PeriodicalId\":187825,\"journal\":{\"name\":\"2023 12th Mediterranean Conference on Embedded Computing (MECO)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-06-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 12th Mediterranean Conference on Embedded Computing (MECO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MECO58584.2023.10155013\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 12th Mediterranean Conference on Embedded Computing (MECO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MECO58584.2023.10155013","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

传感器是工厂自动化的重要组成部分。它们的可靠性可以通过使用三模冗余(Triple Modular Redundancy, TMR)等容错架构来提高。此外,错误检测和诊断可以显著减少停机时间。本文首先提出了一种模拟错误检测和屏蔽(AEDM)电路,只要三个模拟传感器中至少有两个是可操作的,即使读数不相同,也能产生正确的模拟读数。这个电路在模拟域工作。然后将其与文献中的数字错误检测和掩蔽(DEDM)电路相结合,并证明该组合机制可以在识别故障类型(传感器故障或模数转换器(ADC)故障)的同时检测到最多一种故障。该机制然后通过添加两个多路复用器来略微调整,以同时检测最多两个故障(一个传感器和一个ADC)。这两种机制都可以将正确的输出传播到系统的其余部分,同时还可以识别错误模块,从而更容易诊断并减少修复时间。在ELDO上成功地模拟了AEDM。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Error Detection and Masking Circuit with High Diagnosability for Redundant Sensors
Sensors are essential components in factory automation. Their reliability can be increased by using fault-tolerant architectures such as Triple Modular Redundancy (TMR). Furthermore, error detection and diagnosis can significantly reduce downtime. This paper first proposes an Analog Error Detection and Masking (AEDM) circuit that produces a correct analog reading as long as at least two of the three analog sensors are operational even if the readings are not identical. This circuit operates in the analog domain. It is then combined with a Digital Error Detection and Masking (DEDM) circuit from the literature, and it is proven that the combined mechanism can detect up to one failure while identifying the failure type (sensor failure or Analog to Digital converter (ADC) failure). This mechanism is then slightly adapted by adding two multiplexers to detect up to two failures simultaneously (one sensor and one ADC). Both mechanisms can propagate a correct output to the rest of the system while also identifying the erroneous modules for easier diagnosis and less repair time. The AEDM was successfully simulated on ELDO.
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