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引用次数: 1
摘要
材料的电性能是设计电磁设备和系统所必需的。自由空间材料测量方法，测量的是位于发射(Tx)/接收(Rx)天线中间的MUT(被测材料)的自由空间散射参数，适用于无需事先加工和物理接触的高频MUT无损检测。本文提出了一种基于平面偏置短的GSS (gate - short - short)校准方法，用于自由空间材料测量系统的校准，测量结果显示在w波段(75-110 GHz)。
GSS (Gated-Short-Short) Calibration for Free-space Material Measurements in millimeter-Wave Frequency Band
Electrical properties of materials are requisite to design electromagnetic (EM) devices and systems. Free-space material measurement method, where the measurands are the free-space scattering parameters of MUT (Material Under Test) located at the middle of transmit (Tx)/receive (Rx) antennas, is suitable for non-destructively testing MUT without prior machining and physical contact in high frequencies. In this paper, GSS (Gated-Short-Short) calibration method using a planar offset short is proposed for calibrating a free-space material measurement system and the measurement result is shown in W-band (75–110 GHz).
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