P. Gornostaev, Viacheslav K. Samojlikov, Maxim S. Golovinskiy, S. Evstafyev
{"title":"用于真空等离子体工艺中基材温度测量的热传感器的开发与设计","authors":"P. Gornostaev, Viacheslav K. Samojlikov, Maxim S. Golovinskiy, S. Evstafyev","doi":"10.1109/ElConRus51938.2021.9396518","DOIUrl":null,"url":null,"abstract":"Methods and devices used in the manufacture of electronic products for determining the thermal state of substrates are discussed. The methods were evaluated according to a number of criteria important for temperature measurements: performance, noise immunity, sensitivity, temperature range of measurements. Original devices and methods for measuring the operating temperature of substrates in vacuum-plasma processes have been developed.","PeriodicalId":447345,"journal":{"name":"2021 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-01-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Development and Research of the Design of a Thermal Sensor for Measuring the Temperature of the Substrate Processed in Vacuum-Plasma Processes\",\"authors\":\"P. Gornostaev, Viacheslav K. Samojlikov, Maxim S. Golovinskiy, S. Evstafyev\",\"doi\":\"10.1109/ElConRus51938.2021.9396518\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Methods and devices used in the manufacture of electronic products for determining the thermal state of substrates are discussed. The methods were evaluated according to a number of criteria important for temperature measurements: performance, noise immunity, sensitivity, temperature range of measurements. Original devices and methods for measuring the operating temperature of substrates in vacuum-plasma processes have been developed.\",\"PeriodicalId\":447345,\"journal\":{\"name\":\"2021 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-01-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ElConRus51938.2021.9396518\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ElConRus51938.2021.9396518","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Development and Research of the Design of a Thermal Sensor for Measuring the Temperature of the Substrate Processed in Vacuum-Plasma Processes
Methods and devices used in the manufacture of electronic products for determining the thermal state of substrates are discussed. The methods were evaluated according to a number of criteria important for temperature measurements: performance, noise immunity, sensitivity, temperature range of measurements. Original devices and methods for measuring the operating temperature of substrates in vacuum-plasma processes have been developed.