{"title":"电信电池失效时间预测的统计参数模型","authors":"R.K. Jaworski","doi":"10.1109/INTLEC.1999.794114","DOIUrl":null,"url":null,"abstract":"An improved method of analysis of battery aging is presented. This method is based on the analysis of statistical distribution of the ambient temperature at battery locations. It is an extension of an earlier model. The flexibility of the new method was largely extended through the use of statistical distribution parameters of ambient temperature instead of ambient temperature time series in battery aging calculations. Despite its simplicity, this new approach does not sacrifice the accuracy of the battery aging rate estimates since it accounts for temperature fluctuations experienced by batteries in the field.","PeriodicalId":215980,"journal":{"name":"21st International Telecommunications Energy Conference. INTELEC '99 (Cat. No.99CH37007)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Statistical parameters model for predicting time to failure of telecommunications batteries\",\"authors\":\"R.K. Jaworski\",\"doi\":\"10.1109/INTLEC.1999.794114\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An improved method of analysis of battery aging is presented. This method is based on the analysis of statistical distribution of the ambient temperature at battery locations. It is an extension of an earlier model. The flexibility of the new method was largely extended through the use of statistical distribution parameters of ambient temperature instead of ambient temperature time series in battery aging calculations. Despite its simplicity, this new approach does not sacrifice the accuracy of the battery aging rate estimates since it accounts for temperature fluctuations experienced by batteries in the field.\",\"PeriodicalId\":215980,\"journal\":{\"name\":\"21st International Telecommunications Energy Conference. INTELEC '99 (Cat. No.99CH37007)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"21st International Telecommunications Energy Conference. INTELEC '99 (Cat. No.99CH37007)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INTLEC.1999.794114\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st International Telecommunications Energy Conference. INTELEC '99 (Cat. No.99CH37007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INTLEC.1999.794114","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Statistical parameters model for predicting time to failure of telecommunications batteries
An improved method of analysis of battery aging is presented. This method is based on the analysis of statistical distribution of the ambient temperature at battery locations. It is an extension of an earlier model. The flexibility of the new method was largely extended through the use of statistical distribution parameters of ambient temperature instead of ambient temperature time series in battery aging calculations. Despite its simplicity, this new approach does not sacrifice the accuracy of the battery aging rate estimates since it accounts for temperature fluctuations experienced by batteries in the field.