测量方法和冷却系统对功率mosfet结温所得值的影响

K. Górecki, K. Posobkiewicz
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引用次数: 0

摘要

分析了应用的测量方法对不同冷却系统下功率MOS晶体管热参数测量结果的影响。考虑了间接电法、高温法和接触法。对不同的被动和主动冷却系统进行了实验研究。对得到的测量结果进行了比较,并对测量结果之间的差异进行了评价。在此基础上,指出了所考虑的测量方法在评估所考虑的功率晶体管热性能方面的适用范围。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Influence of the Measurement Method and the Cooling System on the Obtained Values of the Junction Temperature of Power MOSFETs
The paper analyzes the influence of the applied measurement method on the measurement results of thermal parameters of power MOS transistors operating in different cooling systems. The indirect electrical method, the pyrometric method and the contact method are considered. Experimental studies are carried out for different passive and active cooling systems. The obtained measurement results are compared and the discrepancies between the measurement results are evaluated. Based on the investigations, the range of usefulness of the considered measurement methods for the evaluation of thermal properties of the considered power transistors is indicated.
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