高dv/dt和高开关频率下定子绕组绝缘退化实验设计

F. Alvarez-Gonzalez, D. Hewitt, A. Griffo, Jiabin Wang, M. Diab, Xibo Yuan
{"title":"高dv/dt和高开关频率下定子绕组绝缘退化实验设计","authors":"F. Alvarez-Gonzalez, D. Hewitt, A. Griffo, Jiabin Wang, M. Diab, Xibo Yuan","doi":"10.1109/ECCE44975.2020.9235940","DOIUrl":null,"url":null,"abstract":"SiC power devices are gaining increased interest due to their superior performance and increased efficiency in motor drives compared to traditional Si-based IGBT converters. However, the increased switching frequency and much faster switching transients (high dv/dt) of Silicon Carbide (SiC) compared to their IGBT counterparts, can result in increased stress in electrical machines. To quantify these detrimental effects on machine insulation lifetime, a series of tests are conducted on electrical stators representative of typical low voltage machines used in traction and industrial applications. A Design of Experiment (DoE) methodology is employed to identify the test sequence using three stressors. In particular, three values of DC link voltage level, rise time or slew rate of the voltage waveform, and switching frequency, respectively are considered. The paper describes the planned tests and conditions, the insulation health monitoring method employed, and preliminary results.","PeriodicalId":433712,"journal":{"name":"2020 IEEE Energy Conversion Congress and Exposition (ECCE)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Design of Experiments for Stator Windings Insulation Degradation under High dv/dt and High Switching Frequency\",\"authors\":\"F. Alvarez-Gonzalez, D. Hewitt, A. Griffo, Jiabin Wang, M. Diab, Xibo Yuan\",\"doi\":\"10.1109/ECCE44975.2020.9235940\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"SiC power devices are gaining increased interest due to their superior performance and increased efficiency in motor drives compared to traditional Si-based IGBT converters. However, the increased switching frequency and much faster switching transients (high dv/dt) of Silicon Carbide (SiC) compared to their IGBT counterparts, can result in increased stress in electrical machines. To quantify these detrimental effects on machine insulation lifetime, a series of tests are conducted on electrical stators representative of typical low voltage machines used in traction and industrial applications. A Design of Experiment (DoE) methodology is employed to identify the test sequence using three stressors. In particular, three values of DC link voltage level, rise time or slew rate of the voltage waveform, and switching frequency, respectively are considered. The paper describes the planned tests and conditions, the insulation health monitoring method employed, and preliminary results.\",\"PeriodicalId\":433712,\"journal\":{\"name\":\"2020 IEEE Energy Conversion Congress and Exposition (ECCE)\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-10-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE Energy Conversion Congress and Exposition (ECCE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECCE44975.2020.9235940\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Energy Conversion Congress and Exposition (ECCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCE44975.2020.9235940","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

与传统的硅基IGBT转换器相比,SiC功率器件由于其优越的性能和更高的电机驱动效率而获得越来越多的关注。然而,与IGBT相比,碳化硅(SiC)增加的开关频率和更快的开关瞬态(高dv/dt)会导致电机中的应力增加。为了量化这些对机器绝缘寿命的有害影响,对牵引和工业应用中使用的典型低压机器的电气定子进行了一系列测试。采用实验设计(DoE)方法确定了三种压力源的测试顺序。特别考虑了直流链路电压电平、电压波形上升时间或摆压率、开关频率三个值。本文介绍了计划的试验和条件、采用的绝缘健康监测方法和初步结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design of Experiments for Stator Windings Insulation Degradation under High dv/dt and High Switching Frequency
SiC power devices are gaining increased interest due to their superior performance and increased efficiency in motor drives compared to traditional Si-based IGBT converters. However, the increased switching frequency and much faster switching transients (high dv/dt) of Silicon Carbide (SiC) compared to their IGBT counterparts, can result in increased stress in electrical machines. To quantify these detrimental effects on machine insulation lifetime, a series of tests are conducted on electrical stators representative of typical low voltage machines used in traction and industrial applications. A Design of Experiment (DoE) methodology is employed to identify the test sequence using three stressors. In particular, three values of DC link voltage level, rise time or slew rate of the voltage waveform, and switching frequency, respectively are considered. The paper describes the planned tests and conditions, the insulation health monitoring method employed, and preliminary results.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信