基于时变电阻的导电环动态接触电阻测试仪标定源的研制

Ming Yan, Congru Yin, Yue He, Tiantian Li
{"title":"基于时变电阻的导电环动态接触电阻测试仪标定源的研制","authors":"Ming Yan, Congru Yin, Yue He, Tiantian Li","doi":"10.1109/ICEMI52946.2021.9679587","DOIUrl":null,"url":null,"abstract":"The conductive ring dynamic contact resistance tester is a necessary instrument and equipment in many fields, such as national defense and military industry. Based on the research of the working principle and measurement characteristics of the conductive ring dynamic contact resistance tester, this paper proposed that the calibration parameters are incomplete when the DC resistance box is used for calibration. In response to this problem, this paper proposed a time-varying resistance standard as a calibration source. The calibration source is controlled by the timing module. The constant current active adjustable resistance generation module outputs the resistance at a timing. The resistance change rate is 10ksa/s and the resistance output range is from 10mΩ to 100Ω. It can realize the full parameter calibration of resistance parameters and sampling rate parameters of the conductive ring dynamic contact resistance tester, ensuring the quality control of this kind of equipment.","PeriodicalId":289132,"journal":{"name":"2021 IEEE 15th International Conference on Electronic Measurement & Instruments (ICEMI)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Development of Calibration Source for Dynamic Contact Resistance Tester of Conductive Ring Based on Time-Varying Resistance\",\"authors\":\"Ming Yan, Congru Yin, Yue He, Tiantian Li\",\"doi\":\"10.1109/ICEMI52946.2021.9679587\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The conductive ring dynamic contact resistance tester is a necessary instrument and equipment in many fields, such as national defense and military industry. Based on the research of the working principle and measurement characteristics of the conductive ring dynamic contact resistance tester, this paper proposed that the calibration parameters are incomplete when the DC resistance box is used for calibration. In response to this problem, this paper proposed a time-varying resistance standard as a calibration source. The calibration source is controlled by the timing module. The constant current active adjustable resistance generation module outputs the resistance at a timing. The resistance change rate is 10ksa/s and the resistance output range is from 10mΩ to 100Ω. It can realize the full parameter calibration of resistance parameters and sampling rate parameters of the conductive ring dynamic contact resistance tester, ensuring the quality control of this kind of equipment.\",\"PeriodicalId\":289132,\"journal\":{\"name\":\"2021 IEEE 15th International Conference on Electronic Measurement & Instruments (ICEMI)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 15th International Conference on Electronic Measurement & Instruments (ICEMI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEMI52946.2021.9679587\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 15th International Conference on Electronic Measurement & Instruments (ICEMI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEMI52946.2021.9679587","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

导电环动态接触电阻测试仪是国防、军工等诸多领域的必备仪器设备。本文在研究导电环动态接触电阻测试仪的工作原理和测量特性的基础上,提出了采用直流电阻箱进行标定时标定参数不完整的问题。针对这一问题,本文提出了时变电阻标准作为校准源。校准源由定时模块控制。恒流有源可调电阻产生模块定时输出该电阻。电阻变化率为10ksa/s,电阻输出范围为10mΩ ~ 100Ω。可实现导电环动态接触电阻测试仪的电阻参数和采样率参数的全参数校准,保证了该类设备的质量控制。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Development of Calibration Source for Dynamic Contact Resistance Tester of Conductive Ring Based on Time-Varying Resistance
The conductive ring dynamic contact resistance tester is a necessary instrument and equipment in many fields, such as national defense and military industry. Based on the research of the working principle and measurement characteristics of the conductive ring dynamic contact resistance tester, this paper proposed that the calibration parameters are incomplete when the DC resistance box is used for calibration. In response to this problem, this paper proposed a time-varying resistance standard as a calibration source. The calibration source is controlled by the timing module. The constant current active adjustable resistance generation module outputs the resistance at a timing. The resistance change rate is 10ksa/s and the resistance output range is from 10mΩ to 100Ω. It can realize the full parameter calibration of resistance parameters and sampling rate parameters of the conductive ring dynamic contact resistance tester, ensuring the quality control of this kind of equipment.
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