Automated SC-MCC Test Case Generation

In the case of safety-critical applications, software testing plays an important role, as such applications failure results in huge financial losses or even human fatality. Hence, a systematic certification process, DO-178B that ensures safe software systems are adapted in the aviation industry. Currently, one of its key objectives is to hold satisfactory Multiple Condition/Decision Coverage(MC/DC) coverage. Among other code coverage criteria, the MC/DC is preferred due to its linear number of test case generation from N+1 to 2N, where N is the total number of Atomic Conditions in a Boolean expression. Indeed, this number is relatively better than the exponential test cases generated for Multiple Condition Coverage(MCC) i.e. 2N. However, since most of the safety-critical applications are being developed using high-level languages that have Short-Circuit evaluation property, there is no need to test an application by ignoring this property. Hence, MCC with Short-Circuit evaluation(SC-MCC) is recommended. In this research work, we aim to demonstrate the effectiveness of SC-MCC with the help of the well-known Automated Test Case Generation techniques such as Bounded Model Checker, Coverage Guided Fuzzing, Dynamic Symbolic Execution, and DSE with Interpolation.