基于深度学习的标准化流程工业装配线视觉质量检测

Robert F. Maack, Hasan Tercan, Tobias Meisen
{"title":"基于深度学习的标准化流程工业装配线视觉质量检测","authors":"Robert F. Maack, Hasan Tercan, Tobias Meisen","doi":"10.1109/INDIN51773.2022.9976097","DOIUrl":null,"url":null,"abstract":"The assembly line production of electrical consumer products is a highly streamlined process in which the product quality is continuously evaluated using automated checks. However, some products include manual processing due to customer requests that are not covered by standardized production plans. In such situations, quality issues frequently remain unnoticed leading to high reversal costs and customer dissatisfaction. We address this problem in a practical case study for a specific product family that is subject to highly versatile and error-prone configurations of externally exposed hardware connectors. In this setting, the worker must be visually assisted such that potentially faulty configurations are highlighted. Therefore, we investigate the applicability of state-of-the-art approaches for Anomaly Detection (AD) and Anomaly Localization (AL) on image data using pre-trained models and normalizing flows and compare against baseline Variational Auto-Encoders (VAEs). We show that those methods are not only applicable to well-established benchmarks on industrial image data but also have the potential to be used in a practical use case.","PeriodicalId":359190,"journal":{"name":"2022 IEEE 20th International Conference on Industrial Informatics (INDIN)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2022-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Deep Learning based Visual Quality Inspection for Industrial Assembly Line Production using Normalizing Flows\",\"authors\":\"Robert F. Maack, Hasan Tercan, Tobias Meisen\",\"doi\":\"10.1109/INDIN51773.2022.9976097\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The assembly line production of electrical consumer products is a highly streamlined process in which the product quality is continuously evaluated using automated checks. However, some products include manual processing due to customer requests that are not covered by standardized production plans. In such situations, quality issues frequently remain unnoticed leading to high reversal costs and customer dissatisfaction. We address this problem in a practical case study for a specific product family that is subject to highly versatile and error-prone configurations of externally exposed hardware connectors. In this setting, the worker must be visually assisted such that potentially faulty configurations are highlighted. Therefore, we investigate the applicability of state-of-the-art approaches for Anomaly Detection (AD) and Anomaly Localization (AL) on image data using pre-trained models and normalizing flows and compare against baseline Variational Auto-Encoders (VAEs). We show that those methods are not only applicable to well-established benchmarks on industrial image data but also have the potential to be used in a practical use case.\",\"PeriodicalId\":359190,\"journal\":{\"name\":\"2022 IEEE 20th International Conference on Industrial Informatics (INDIN)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-07-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE 20th International Conference on Industrial Informatics (INDIN)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INDIN51773.2022.9976097\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 20th International Conference on Industrial Informatics (INDIN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INDIN51773.2022.9976097","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

电子消费品的装配线生产是一个高度精简的过程,在这个过程中,产品质量是通过自动检查不断评估的。然而,由于标准化生产计划不包括客户的要求,一些产品包括手工加工。在这种情况下,质量问题经常不被注意,导致高逆转成本和客户不满。我们在一个实际案例研究中解决了这个问题,该案例研究针对的是一个特定的产品系列,该产品系列受制于外部暴露的硬件连接器的高度通用和容易出错的配置。在这种情况下,工作人员必须在视觉上得到帮助,以便突出显示潜在的错误配置。因此,我们研究了使用预训练模型和规范化流对图像数据进行异常检测(AD)和异常定位(AL)的最先进方法的适用性,并与基线变分自编码器(VAEs)进行了比较。我们表明,这些方法不仅适用于工业图像数据的成熟基准,而且还具有在实际用例中使用的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Deep Learning based Visual Quality Inspection for Industrial Assembly Line Production using Normalizing Flows
The assembly line production of electrical consumer products is a highly streamlined process in which the product quality is continuously evaluated using automated checks. However, some products include manual processing due to customer requests that are not covered by standardized production plans. In such situations, quality issues frequently remain unnoticed leading to high reversal costs and customer dissatisfaction. We address this problem in a practical case study for a specific product family that is subject to highly versatile and error-prone configurations of externally exposed hardware connectors. In this setting, the worker must be visually assisted such that potentially faulty configurations are highlighted. Therefore, we investigate the applicability of state-of-the-art approaches for Anomaly Detection (AD) and Anomaly Localization (AL) on image data using pre-trained models and normalizing flows and compare against baseline Variational Auto-Encoders (VAEs). We show that those methods are not only applicable to well-established benchmarks on industrial image data but also have the potential to be used in a practical use case.
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