数字计算机和容错系统故障行为的表征

S. Bavuso, P. Miner
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引用次数: 0

摘要

讨论了数字容错系统中潜在故障特征的研究。一系列的研究导致了一个实用的高速门级逻辑模拟器的发展。讨论了采用可故障软件对高速模拟器进行验证,并对MIS-STD-1750A原型处理器进行了硬件仿真。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Characterization of the faulted behavior of digital computers and fault tolerant systems
Research that is being conducted to characterize the latent fault in digital fault-tolerant systems is addressed. A series of investigations that have led to the development of a practical high-speed gate-level logic simulator is described. The validation of the high-speed simulator, using faultable software, and hardware simulations of a prototype MIS-STD-1750A processor are discussed.<>
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