Contango: SoC时钟网络的集成优化

Dongjin Lee, I. Markov
{"title":"Contango: SoC时钟网络的集成优化","authors":"Dongjin Lee, I. Markov","doi":"10.1155/2011/407507","DOIUrl":null,"url":null,"abstract":"On-chip clock networks are remarkable in their impact on the performance and power of synchronous circuits, in their susceptibility to adverse effects of semiconductor technology scaling, as well as in their strong potential for improvement through better CAD algorithms and tools. Our work offers new algorithms and a methodology for SPICE-accurate optimization of clock networks, coordinated to satisfy slew constraints and achieve best trade-offs between skew, insertion delay, power, as well as tolerance to variations. Our implementation, called Contango, is evaluated on 45nm benchmarks from IBM Research and Texas Instruments with up to 50K sinks.","PeriodicalId":432902,"journal":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","volume":"63 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":"{\"title\":\"Contango: Integrated optimization of SoC clock networks\",\"authors\":\"Dongjin Lee, I. Markov\",\"doi\":\"10.1155/2011/407507\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"On-chip clock networks are remarkable in their impact on the performance and power of synchronous circuits, in their susceptibility to adverse effects of semiconductor technology scaling, as well as in their strong potential for improvement through better CAD algorithms and tools. Our work offers new algorithms and a methodology for SPICE-accurate optimization of clock networks, coordinated to satisfy slew constraints and achieve best trade-offs between skew, insertion delay, power, as well as tolerance to variations. Our implementation, called Contango, is evaluated on 45nm benchmarks from IBM Research and Texas Instruments with up to 50K sinks.\",\"PeriodicalId\":432902,\"journal\":{\"name\":\"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)\",\"volume\":\"63 5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-03-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"31\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1155/2011/407507\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1155/2011/407507","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 31

摘要

片上时钟网络对同步电路的性能和功率的影响是显著的,对半导体技术缩放的不利影响的敏感性,以及通过更好的CAD算法和工具进行改进的强大潜力。我们的工作为时钟网络的spice精确优化提供了新的算法和方法,协调以满足旋转约束,并在倾斜,插入延迟,功率以及变化容忍度之间实现最佳权衡。我们的实现称为Contango,在IBM研究院和德州仪器的45纳米基准测试中进行了评估,最多有5万个接收器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Contango: Integrated optimization of SoC clock networks
On-chip clock networks are remarkable in their impact on the performance and power of synchronous circuits, in their susceptibility to adverse effects of semiconductor technology scaling, as well as in their strong potential for improvement through better CAD algorithms and tools. Our work offers new algorithms and a methodology for SPICE-accurate optimization of clock networks, coordinated to satisfy slew constraints and achieve best trade-offs between skew, insertion delay, power, as well as tolerance to variations. Our implementation, called Contango, is evaluated on 45nm benchmarks from IBM Research and Texas Instruments with up to 50K sinks.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信