基于软件的rt级故障注入错误检测技术评价

A. Ammari, R. Leveugle, B. Nicolescu, Y. Savaria
{"title":"基于软件的rt级故障注入错误检测技术评价","authors":"A. Ammari, R. Leveugle, B. Nicolescu, Y. Savaria","doi":"10.1109/DELTA.2006.46","DOIUrl":null,"url":null,"abstract":"This paper discusses the efficiency of a software hardening technique when transient faults occur in the processor elements. Faults are injected in the RT-Level model of the processor, thus providing a more comprehensive view of the robustness compared with injections limited to the registers in the programmer model (e.g. injections based on an Instruction Set Simulator or using instructions of the processor to modify contents of registers).","PeriodicalId":439448,"journal":{"name":"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Evaluation of a software-based error detection technique by RT-level fault injection\",\"authors\":\"A. Ammari, R. Leveugle, B. Nicolescu, Y. Savaria\",\"doi\":\"10.1109/DELTA.2006.46\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses the efficiency of a software hardening technique when transient faults occur in the processor elements. Faults are injected in the RT-Level model of the processor, thus providing a more comprehensive view of the robustness compared with injections limited to the registers in the programmer model (e.g. injections based on an Instruction Set Simulator or using instructions of the processor to modify contents of registers).\",\"PeriodicalId\":439448,\"journal\":{\"name\":\"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-01-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DELTA.2006.46\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DELTA.2006.46","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文讨论了在处理器元件发生暂态故障时软件加固技术的有效性。故障被注入到处理器的rt级模型中,因此与程序员模型中仅限于寄存器的注入(例如基于指令集模拟器的注入或使用处理器的指令修改寄存器的内容)相比,提供了更全面的鲁棒性视图。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Evaluation of a software-based error detection technique by RT-level fault injection
This paper discusses the efficiency of a software hardening technique when transient faults occur in the processor elements. Faults are injected in the RT-Level model of the processor, thus providing a more comprehensive view of the robustness compared with injections limited to the registers in the programmer model (e.g. injections based on an Instruction Set Simulator or using instructions of the processor to modify contents of registers).
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