用衍射光学元件对技术表面进行光学测试

S. Brinkmann, T. Dresel, R. Schreiner, J. Schwider
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摘要

用于光学表面测试的光学技术通常受到技术表面粗糙度引起的散斑噪声的影响。由于这个原因,技术工件的形状控制通常由触觉轮廓仪进行。掠入射干涉测量法是一种光学的、比机械轮廓测量法快得多的替代方法。它通过将有效测试波长从λ增加到λ/ coscos来抑制散斑噪声,其中φ为入射角[1-3]。衍射光学元件在其表面浮雕中包含理想物体的形状信息,用作工件的参考,可以在一个步骤中对整个地幔表面进行零测试。衍射光学元件的周期p决定了衍射角α=arcsin(λ/p),从而决定了干涉仪的入射角φ =π-α、有效波长λeff=p和灵敏度λeff/2。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optical Testing of Technical Surfaces with Diffractive Optical Elements
Optical techniques which are well established for the testing of optical surfaces usually suffer from speckle noise caused by the roughness of technical surfaces. For this reason the shape control of technical workpieces is commonly carried out by tactile profilometers. An optical and much faster alternative to mechanical profilometry is grazing incidence interferometry. It suppresses speckle noise by increasing the effective test wavelength from λ to λ/cosϑ, where ϑ is the angle of incidence [1-3]. Diffractive optical elements, containing the shape information of an ideal object in their surface relief, are used as references for the workpiece enabling a null test of the entire mantle surface in a single step. The period p of the diffractive optical elements determines the diffraction angle α=arcsin(λ/p) and hereby the angle of incidence ϑ=π-α, the effective wavelength λeff=p and the sensitivity λeff/2 of the interferometer.
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