解码器类型的一种供电电流可测试寄存器串

2011 11th International Symposium on Communications & Information Technologies (ISCIT) Pub Date : 2011-12-01 DOI:10.1109/ISCIT.2011.6092183

M. Hashizume, Yutaka Hata, H. Yotsuyanagi, Y. Miura

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摘要

本文提出了一种面积开销小的译码型供电电流可测电阻串数模转换器和一种供电电流测试方法。利用耗尽测试向量的50%左右，该测试方法可以检测出DAC中的开放缺陷和短缺陷。一些实验表明，我们的可测试的4位和8位dac中的大多数目标缺陷都可以通过测试方法检测出来。

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A supply current testable register string DAC of decoder type

In this paper, we propose a supply current testable resistor string DAC of decoder type whose area overhead is small and a supply current test method. Open defects and short ones in the DAC can be detected by the test method with about 50% of the exhausted test vectors. It is shown by some experiments that most of the targeted defects in our testable DACs of 4 and 8 bits can be detected by the test method.

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2011 11th International Symposium on Communications & Information Technologies (ISCIT)

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