jfet输入,高速比较器标准单元设计在一系列新的模拟阵列上

M. Metcalf
{"title":"jfet输入,高速比较器标准单元设计在一系列新的模拟阵列上","authors":"M. Metcalf","doi":"10.1109/BIPOL.1988.51050","DOIUrl":null,"url":null,"abstract":"A monolithic JFET input comparator with performance that far exceeds any prior art has been designed on a semicustom IC. The use of the analog array provided benefits in design effort, manufacturing time and layout versatility without sacrificing excellence performance.<<ETX>>","PeriodicalId":302949,"journal":{"name":"Proceedings of the 1988 Bipolar Circuits and Technology Meeting,","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"JFET-input, high speed comparator standard cell designed on a new series of analog arrays\",\"authors\":\"M. Metcalf\",\"doi\":\"10.1109/BIPOL.1988.51050\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A monolithic JFET input comparator with performance that far exceeds any prior art has been designed on a semicustom IC. The use of the analog array provided benefits in design effort, manufacturing time and layout versatility without sacrificing excellence performance.<<ETX>>\",\"PeriodicalId\":302949,\"journal\":{\"name\":\"Proceedings of the 1988 Bipolar Circuits and Technology Meeting,\",\"volume\":\"65 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-09-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 1988 Bipolar Circuits and Technology Meeting,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BIPOL.1988.51050\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 1988 Bipolar Circuits and Technology Meeting,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BIPOL.1988.51050","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

在半定制集成电路上设计了一种性能远远超过现有技术的单片JFET输入比较器。使用模拟阵列在设计工作,制造时间和布局通用性方面提供了好处,而不会牺牲卓越的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
JFET-input, high speed comparator standard cell designed on a new series of analog arrays
A monolithic JFET input comparator with performance that far exceeds any prior art has been designed on a semicustom IC. The use of the analog array provided benefits in design effort, manufacturing time and layout versatility without sacrificing excellence performance.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信