MESFET参数提取过程中产生的条件数

Proceedings of SOUTHEASTCON '96 Pub Date : 1996-04-11 DOI:10.1109/SECON.1996.510095

F. D. King, P. Winson, A. Snider, L. Dunleavy, D. Levinson

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引用次数: 1

摘要

对于标准的小信号MESFET模型，推导并评估了表示计算电路元件值对s参数测量误差敏感性的条件数。条件数揭示了晶体管建模师在提取输入电阻的准确值时遇到的常见困难。其他元素也根据它们的灵敏度进行分类。

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The condition numbers arising in MESFET parameter extraction

Conditions numbers expressing the sensitivity of computed circuit element values to inaccuracies in S-parameter measurements are derived and evaluated for a standard small-signal MESFET model. The condition numbers shed light on the common difficulty experienced by transistor modelers in extracting accurate values for the input resistance. Other elements are also classified according to their sensitivity.

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Proceedings of SOUTHEASTCON '96

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