{"title":"利用准网络方法模拟导波结构中的电磁场:频域传输线矩阵法","authors":"R. Vahldieck","doi":"10.1109/ICECS.1996.582824","DOIUrl":null,"url":null,"abstract":"The frequency-domain transmission line matrix (FDTLM) method is a computationally efficient analysis tool for the characterization of planar transmission lines and waveguides. The method relates network quantities like voltages and currents to fields and utilizes network theory to quantify the field parameters. This paper gives a brief review of the FDTLM method and shows how the network approach is utilized to simulate propagation and scattering of electromagnetic fields in planar guided wave structures etched on insulating and semiconducting substrate (MIS CPW). A dispersion analysis illustrates the accuracy of the numerical result. Various application examples demonstrate the flexibility of this new technique.","PeriodicalId":402369,"journal":{"name":"Proceedings of Third International Conference on Electronics, Circuits, and Systems","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Simulation of electromagnetic fields in guided wave structures using a quasi-network approach: the frequency-domain transmission line matrix method\",\"authors\":\"R. Vahldieck\",\"doi\":\"10.1109/ICECS.1996.582824\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The frequency-domain transmission line matrix (FDTLM) method is a computationally efficient analysis tool for the characterization of planar transmission lines and waveguides. The method relates network quantities like voltages and currents to fields and utilizes network theory to quantify the field parameters. This paper gives a brief review of the FDTLM method and shows how the network approach is utilized to simulate propagation and scattering of electromagnetic fields in planar guided wave structures etched on insulating and semiconducting substrate (MIS CPW). A dispersion analysis illustrates the accuracy of the numerical result. Various application examples demonstrate the flexibility of this new technique.\",\"PeriodicalId\":402369,\"journal\":{\"name\":\"Proceedings of Third International Conference on Electronics, Circuits, and Systems\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-10-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Third International Conference on Electronics, Circuits, and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICECS.1996.582824\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Third International Conference on Electronics, Circuits, and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.1996.582824","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simulation of electromagnetic fields in guided wave structures using a quasi-network approach: the frequency-domain transmission line matrix method
The frequency-domain transmission line matrix (FDTLM) method is a computationally efficient analysis tool for the characterization of planar transmission lines and waveguides. The method relates network quantities like voltages and currents to fields and utilizes network theory to quantify the field parameters. This paper gives a brief review of the FDTLM method and shows how the network approach is utilized to simulate propagation and scattering of electromagnetic fields in planar guided wave structures etched on insulating and semiconducting substrate (MIS CPW). A dispersion analysis illustrates the accuracy of the numerical result. Various application examples demonstrate the flexibility of this new technique.