{"title":"容错硬件体系结构综述","authors":"Kai Liu, Yu Li, Ouyang Ling","doi":"10.1109/IEEECONF52377.2022.10013336","DOIUrl":null,"url":null,"abstract":"Fault tolerance is gaining more and more attention for the increasing need of reliability in industrial, automotive and aerospace applications. This paper presents a survey of the fault tolerance mechanism to provide reliability against radiation-induced soft errors at the hardware architectural level. Multiple types of error detection and error recovery mechanisms based on lockstep are described in this article, and a discussion of their advantages and disadvantages is given at the end.","PeriodicalId":193681,"journal":{"name":"2021 International Conference on Advanced Computing and Endogenous Security","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A survey of fault tolerance hardware architecture\",\"authors\":\"Kai Liu, Yu Li, Ouyang Ling\",\"doi\":\"10.1109/IEEECONF52377.2022.10013336\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fault tolerance is gaining more and more attention for the increasing need of reliability in industrial, automotive and aerospace applications. This paper presents a survey of the fault tolerance mechanism to provide reliability against radiation-induced soft errors at the hardware architectural level. Multiple types of error detection and error recovery mechanisms based on lockstep are described in this article, and a discussion of their advantages and disadvantages is given at the end.\",\"PeriodicalId\":193681,\"journal\":{\"name\":\"2021 International Conference on Advanced Computing and Endogenous Security\",\"volume\":\"59 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-04-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 International Conference on Advanced Computing and Endogenous Security\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEEECONF52377.2022.10013336\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 International Conference on Advanced Computing and Endogenous Security","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEEECONF52377.2022.10013336","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fault tolerance is gaining more and more attention for the increasing need of reliability in industrial, automotive and aerospace applications. This paper presents a survey of the fault tolerance mechanism to provide reliability against radiation-induced soft errors at the hardware architectural level. Multiple types of error detection and error recovery mechanisms based on lockstep are described in this article, and a discussion of their advantages and disadvantages is given at the end.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
