Ho-Yun Lee, Yeonjin Kim, Do-Yeon Hwang, Jin-Gyun Chung
{"title":"基于变长移动平均滤波器的缺陷检测系统峰值变化检测","authors":"Ho-Yun Lee, Yeonjin Kim, Do-Yeon Hwang, Jin-Gyun Chung","doi":"10.1109/ISOCC47750.2019.9027754","DOIUrl":null,"url":null,"abstract":"In defects inspection systems, reflected waves are usually corrupted with undesirable signals such as noise and interferences. Thus, to inspect a material accurately, it is desired to remove undesirable signals from the reflected wave. In this paper, a detection method of peak variation of the received signal is proposed. The proposed method is based on a variable length moving average filter to adjust the slope of the received wave as well as to reduce the effect of noise signals. The proposed algorithm is implemented using an FPGA board and it is demonstrated that the implemented system works quite successfully.","PeriodicalId":113802,"journal":{"name":"2019 International SoC Design Conference (ISOCC)","volume":"75 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Peak Variation Detection Using Variable Length Moving Average Filter for Defects Inspection Systems\",\"authors\":\"Ho-Yun Lee, Yeonjin Kim, Do-Yeon Hwang, Jin-Gyun Chung\",\"doi\":\"10.1109/ISOCC47750.2019.9027754\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In defects inspection systems, reflected waves are usually corrupted with undesirable signals such as noise and interferences. Thus, to inspect a material accurately, it is desired to remove undesirable signals from the reflected wave. In this paper, a detection method of peak variation of the received signal is proposed. The proposed method is based on a variable length moving average filter to adjust the slope of the received wave as well as to reduce the effect of noise signals. The proposed algorithm is implemented using an FPGA board and it is demonstrated that the implemented system works quite successfully.\",\"PeriodicalId\":113802,\"journal\":{\"name\":\"2019 International SoC Design Conference (ISOCC)\",\"volume\":\"75 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 International SoC Design Conference (ISOCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISOCC47750.2019.9027754\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International SoC Design Conference (ISOCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISOCC47750.2019.9027754","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Peak Variation Detection Using Variable Length Moving Average Filter for Defects Inspection Systems
In defects inspection systems, reflected waves are usually corrupted with undesirable signals such as noise and interferences. Thus, to inspect a material accurately, it is desired to remove undesirable signals from the reflected wave. In this paper, a detection method of peak variation of the received signal is proposed. The proposed method is based on a variable length moving average filter to adjust the slope of the received wave as well as to reduce the effect of noise signals. The proposed algorithm is implemented using an FPGA board and it is demonstrated that the implemented system works quite successfully.