用电子背散射衍射(EBSD)分析磁铁矿薄膜的晶体取向

INTERMAG 2006 - IEEE International Magnetics Conference Pub Date : 2006-05-08 DOI:10.1109/INTMAG.2006.375455

A. Koblischka-Veneva, M. Koblischka, F. Muecklich, S. Murphy, Y. Zhou, I. Shvets

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引用次数: 0

摘要

利用氧等离子体辅助分子束外延在MgO[001]衬底上生长Fe3O4[001]薄膜，并在250℃的空气中进行退火。通过记录菊池模式，进行了两次自动EBSD扫描来研究晶体取向。

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Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD)

Fe3O4[001] thin films is grown on MgO[001] substrates using oxygen-plasma-assisted molecular beam epitaxy and annealed in air at 250 degC. Automated EBSD scans is performed twice to study the crystallographic orientation by means of recording of Kikuchi patterns.

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INTERMAG 2006 - IEEE International Magnetics Conference

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