{"title":"数字法医检验的两种模式","authors":"F. Cohen","doi":"10.1109/SADFE.2009.8","DOIUrl":null,"url":null,"abstract":"This paper examines an existing cost model of digital forensic examination and describes a new model of examination. Alternative approaches to the previous techniques are identified including optimization approaches for determining examination order and alternative evaluation methods for optimization criteria.","PeriodicalId":101922,"journal":{"name":"2009 Fourth International IEEE Workshop on Systematic Approaches to Digital Forensic Engineering","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"26","resultStr":"{\"title\":\"Two Models of Digital Forensic Examination\",\"authors\":\"F. Cohen\",\"doi\":\"10.1109/SADFE.2009.8\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper examines an existing cost model of digital forensic examination and describes a new model of examination. Alternative approaches to the previous techniques are identified including optimization approaches for determining examination order and alternative evaluation methods for optimization criteria.\",\"PeriodicalId\":101922,\"journal\":{\"name\":\"2009 Fourth International IEEE Workshop on Systematic Approaches to Digital Forensic Engineering\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"26\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 Fourth International IEEE Workshop on Systematic Approaches to Digital Forensic Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SADFE.2009.8\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Fourth International IEEE Workshop on Systematic Approaches to Digital Forensic Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SADFE.2009.8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper examines an existing cost model of digital forensic examination and describes a new model of examination. Alternative approaches to the previous techniques are identified including optimization approaches for determining examination order and alternative evaluation methods for optimization criteria.