寻找具有代表性和低成本的微控制器间歇故障模型:一个案例研究

J. Gracia, D. Gil, J. Baraza, L. J. Saiz, P. Gil
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引用次数: 9

摘要

间歇性故障预计是VLSI电路中的一个巨大挑战。制造过程的复杂性,引发残留物和工艺变化,以及特殊的磨损机制,可能会增加此类故障的存在。这项工作提出了间歇性故障对商业微控制器行为影响的案例研究。通过使用基于vhdl的故障注入,特别是破坏者,我们在微控制器总线中注入了不同的间歇性故障模型,因为它们是关键位置,对间歇性故障可能很敏感。通过对各故障模型实施的影响和可行性进行比较,以选择具有代表性且成本较低的间歇性故障负荷。应用的方法可以推广到注入间歇故障在其他位置,如寄存器和存储器,并验证关键系统的可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Searching Representative and Low Cost Fault Models for Intermittent Faults in Microcontrollers: A Case Study
Intermittent faults are expected to be a great challenge in VLSI circuits. The complexity of manufacturing processes, provoking residues and process variations, and special wear out mechanisms, may increase the presence of such faults. This work presents a case study of the effects of intermittent faults on the behavior of a commercial micro controller. By using VHDL-based fault injection, particularly saboteurs, we have injected different intermittent fault models in the micro controller buses, as they are critical locations, potentially sensitive to intermittent faults. We have compared the impact and the feasibility of implementation of the fault models, in order to select a representative and low cost intermittent fault load. The applied methodology can be generalized to inject intermittent faults in other locations, such as registers and memory, and to validate the dependability of critical systems.
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