采用多栅极氧化物双工作功能(MGO-DWF)-MO场效应晶体管,具有高抗漏击穿电压的150 GHz FMAX

T. Miyata, H. Tanaka, K. Kagimoto, M. Kamiyashiki, M. Kamimura, A. Hidaka, M. Goto, K. Adachi, A. Hokazono, T. Ohguro, K. Nagaoka, Y. Watanabe, S. Hirooka, Y. Ito, S. Kawanaka, K. Ishimaru
{"title":"采用多栅极氧化物双工作功能(MGO-DWF)-MO场效应晶体管,具有高抗漏击穿电压的150 GHz FMAX","authors":"T. Miyata, H. Tanaka, K. Kagimoto, M. Kamiyashiki, M. Kamimura, A. Hidaka, M. Goto, K. Adachi, A. Hokazono, T. Ohguro, K. Nagaoka, Y. Watanabe, S. Hirooka, Y. Ito, S. Kawanaka, K. Ishimaru","doi":"10.1109/IEDM.2015.7409769","DOIUrl":null,"url":null,"abstract":"We propose Multi Gate Oxide - Dual Work-Function (MGO-DWF)-MOSFET which is suitable for low power AB-class RF power amplifier (RF PA). This was examined for the first time by comparing with a standard Cascode connection circuitry composed of LV- and HVMOSFETs. Dramatically improved FMAX (150 GHz) with sufficient drain break-down voltage (VBD) was experimentally confirmed in a practical device structure. MGO-DWF-MOSFET has multiple roles in a unit device such as LV-MOSFET in source side regions and HV-MOSFET in drain side regions. This distinctive structure enables the reduction of the device area and a gate capacitance (CG) with a higher transconductance (GM) and the suppression of drain conductance (GDS). Enhancement of FMAX, in other words, DC operation current reduction is achieved at a given operation point. This indicates that MGO-DWF MOSFET is advantageous for low power amplifier circuitry applications, typically for RF PA in internet of things (IoT) products.","PeriodicalId":336637,"journal":{"name":"2015 IEEE International Electron Devices Meeting (IEDM)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"150 GHz FMAX with high drain breakdown voltage immunity by multi gate oxide dual work-function (MGO-DWF)-MO SFET\",\"authors\":\"T. Miyata, H. Tanaka, K. Kagimoto, M. Kamiyashiki, M. Kamimura, A. Hidaka, M. Goto, K. Adachi, A. Hokazono, T. Ohguro, K. Nagaoka, Y. Watanabe, S. Hirooka, Y. Ito, S. Kawanaka, K. Ishimaru\",\"doi\":\"10.1109/IEDM.2015.7409769\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose Multi Gate Oxide - Dual Work-Function (MGO-DWF)-MOSFET which is suitable for low power AB-class RF power amplifier (RF PA). This was examined for the first time by comparing with a standard Cascode connection circuitry composed of LV- and HVMOSFETs. Dramatically improved FMAX (150 GHz) with sufficient drain break-down voltage (VBD) was experimentally confirmed in a practical device structure. MGO-DWF-MOSFET has multiple roles in a unit device such as LV-MOSFET in source side regions and HV-MOSFET in drain side regions. This distinctive structure enables the reduction of the device area and a gate capacitance (CG) with a higher transconductance (GM) and the suppression of drain conductance (GDS). Enhancement of FMAX, in other words, DC operation current reduction is achieved at a given operation point. This indicates that MGO-DWF MOSFET is advantageous for low power amplifier circuitry applications, typically for RF PA in internet of things (IoT) products.\",\"PeriodicalId\":336637,\"journal\":{\"name\":\"2015 IEEE International Electron Devices Meeting (IEDM)\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE International Electron Devices Meeting (IEDM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2015.7409769\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2015.7409769","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

我们提出了一种适用于低功率ab级射频功率放大器(RF PA)的多栅氧化-双工作功能(MGO-DWF)- mosfet。这是第一次通过与由低压和高压mosfet组成的标准级联电路进行比较来检验。在实际器件结构中,通过实验验证了具有足够漏极击穿电压(VBD)的显著改进FMAX (150 GHz)。MGO-DWF-MOSFET在单元器件中具有多种作用,例如源侧的LV-MOSFET和漏侧的HV-MOSFET。这种独特的结构能够减少器件面积和栅极电容(CG),具有更高的跨导(GM)和抑制漏极电导(GDS)。FMAX的增强,即在给定的工作点上实现直流工作电流的减小。这表明MGO-DWF MOSFET对于低功率放大器电路应用是有利的,通常用于物联网(IoT)产品中的RF PA。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
150 GHz FMAX with high drain breakdown voltage immunity by multi gate oxide dual work-function (MGO-DWF)-MO SFET
We propose Multi Gate Oxide - Dual Work-Function (MGO-DWF)-MOSFET which is suitable for low power AB-class RF power amplifier (RF PA). This was examined for the first time by comparing with a standard Cascode connection circuitry composed of LV- and HVMOSFETs. Dramatically improved FMAX (150 GHz) with sufficient drain break-down voltage (VBD) was experimentally confirmed in a practical device structure. MGO-DWF-MOSFET has multiple roles in a unit device such as LV-MOSFET in source side regions and HV-MOSFET in drain side regions. This distinctive structure enables the reduction of the device area and a gate capacitance (CG) with a higher transconductance (GM) and the suppression of drain conductance (GDS). Enhancement of FMAX, in other words, DC operation current reduction is achieved at a given operation point. This indicates that MGO-DWF MOSFET is advantageous for low power amplifier circuitry applications, typically for RF PA in internet of things (IoT) products.
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