用于低功耗应用的三元SRAM

H. Jayashree, V. P. Sai Shruthi
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引用次数: 4

摘要

本文介绍了三元CMOS SRAM的设计与性能验证。三元SRAM采用180nm、90nm和65nm工艺设计。三元SRAM单元由两个交叉耦合三元逆变器组成。三元SRAM单元的读写操作是在感测放大器、三线调理电路和使用TSPICE的快速解码器的帮助下完成的。由于与传统解码器相比,快速解码器使用的晶体管数量更少,因此所提出的工作可用于低功耗应用。采用65纳米技术的Ternary SRAM阵列模块(1X1)功耗仅为0.608mW,数据访问时间约为9.88ns。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Ternary SRAM for low power applications
Design and Performance verification of Ternary CMOS SRAM is presented in this paper. Ternary SRAM is designed in 180nm, 90nm & 65nm technology process. The Ternary SRAM cell consists of two cross coupled Ternary inverters. READ and WRITE operations of the Ternary SRAM cell are performed with the help of Sense Amplifier, Tritline Conditioning circuits and Fast Decoders using TSPICE. The proposed work can be used for Low Power Application as the Fast Decoders use less number of Transistors compared to the conventional Decoders. The Ternary SRAM array module (1X1) in 65 nm technology consumes only 0.608mW power and data access time is about 9.88ns.
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