从太赫兹光谱学到新型器件

M. Johnston
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引用次数: 0

摘要

实现电子器件中新材料的潜力需要对其电学特性有很好的了解。然而,表征这种材料可能是具有挑战性的,特别是如果对它们进行电接触的技术尚未开发的话。这就是非接触式电导率探头脱颖而出的地方。特别是时间分辨太赫兹光导光谱(TRTPS)是半导体电子特性的一种优秀的自由空间探针,它也允许以亚皮秒的时间分辨率跟踪电荷载流子动力学这样,不仅可以确定材料的关键性能参数,还可以确定电荷形成和重组的参数
本文章由计算机程序翻译,如有差异,请以英文原文为准。
From Terahertz Spectroscopy to Novel Devices
Realising the potential of new materials in electronic devices requires a good understanding of their electrical properties. However, characterizing such materials can be challenging, particularly if the technology for making electrical contacts to them is yet to be developed. This is where non-contact probes of electrical conductivity come to the fore. In particular time-resolved terahertz photoconductivity spectroscopy (TRTPS) is an excellent free-space probe of the electronic properties of semiconductors that also allows charge-carrier dynamics to be followed with sub-picosecond time resolution.1 Thus, not only can the key figures-of-merit of a material be determined, but also parameters of charge formation and recombination.2
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