六方纳米铁氧体在v波段自偏置CMOS片上环行器上的应用

W. Quan, V. Koomson, M. Afsar
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引用次数: 1

摘要

本文介绍了硅片上自偏置微带线钡六方纳米铁氧体(BaM)环行器的设计、仿真、制作和测量结果。该平面y结环行器尺寸为2mm × 2mm × 0.5 mm,未来可与180 nm CMOS技术的前三层集成。采用复合自旋铸造法沉积铁氧体薄膜并进行图案化。采用典型的表征技术,结合自由空间准光学光谱法,研究了120 GHz范围内沉积膜的复介电常数和磁导率。用一组高达67 GHz的圆片探头对所制备的环形器的S参数进行了表征。我们在55ghz下观察到超过15db的非互反现象。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Hexagonal Nano-ferrites used on a V-band Self-bias On-chip Circulator for CMOS
In this work, we present the design, simulation, fabrication and measured results of a self-bias micro-strip line Barium hexagonal Nano-ferrite (BaM) circulator on silicon wafer. This planar Y-junction circulator is 2 mm by 2 mm by 0.5 mm in size, which is capable of future integration with the top three layers of 180 nm CMOS technology. Ferrite thin film is deposited and patterned employing composite spin-casting method. Typical characterization techniques are employed together with free-space quasi-optical spectrometry to study complex permittivity and permeability of deposited film up to 120 GHz. S parameters of fabricated circulators are characterized by a set of on wafer probes up to 67 GHz. We observed over 15 dB non-reciprocal phenomenon at 55 GHz.
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