用k部图计算两两测试集

Elke Salecker, S. Glesner
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引用次数: 2

摘要

许多软件故障是由输入值的异常组合触发的,可以使用覆盖每对输入值的成对测试集来检测。最小尺寸成对测试集的生成是一个np完全问题,这意味着许多算法要么是昂贵的,要么是基于随机过程的。在本文中,我们提出了一个确定性算法,利用我们的观察,两两测试问题可以建模为一个k部图问题。我们使用充分研究的图算法来计算测试集,这些算法利用了k-部图的性质。我们给出了评价结果,证明了我们的算法的适用性,并讨论了我们的方法可能的改进。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Pairwise test set calculation using k-partite graphs
Many software faults are triggered by unusual combinations of input values and can be detected using pairwise test sets that cover each pair of input values. The generation of pairwise test sets with a minimal size is an NP-complete problem which implies that many algorithms are either expensive or based on a random process. In this paper we present a deterministic algorithm that exploits our observation that the pairwise testing problem can be modeled as a k-partite graph problem. We calculate the test set using well investigated graph algorithms that take advantage of properties of k-partite graphs. We present evaluation results that prove the applicability of our algorithm and discuss possible improvement of our approach.
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