基于功能建模的FPGA电路板测试诊断系统设计

Cheng-gang Wang, Jian-hai Li, Jing Sun, Yan-li Sun
{"title":"基于功能建模的FPGA电路板测试诊断系统设计","authors":"Cheng-gang Wang, Jian-hai Li, Jing Sun, Yan-li Sun","doi":"10.1109/EMEIT.2011.6023800","DOIUrl":null,"url":null,"abstract":"Circuit boards composed of the boundary scan and non-boundary scan devices exist widely, and the fault detection and isolation of these non-boundary scan circuit boards is a puzzle for board-level maintenance and testing. Test methods based on boundary scan and digital I/O can not fulfill functional testing of entire circuit board. An automatic test system is constructed and a functional modeling method is put forward for FPGA circuit board testing. First, VITAL model is generated in FPGA development environment, achieving its functional modeling; then VITAL format configuration files and data are imported into LASAR, realizing circuit board simulation and fault simulation, and generating postprocessing documents; finally, postprocessing documents are input into ATE, and the automated testing and fault diagnosis of FPGA circuit board is implemented.","PeriodicalId":221663,"journal":{"name":"International Conference on Electronic and Mechanical Engineering and Information Technology","volume":"120 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Design of test and diagnosis system for FPGA circuit board based on functional modeling\",\"authors\":\"Cheng-gang Wang, Jian-hai Li, Jing Sun, Yan-li Sun\",\"doi\":\"10.1109/EMEIT.2011.6023800\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Circuit boards composed of the boundary scan and non-boundary scan devices exist widely, and the fault detection and isolation of these non-boundary scan circuit boards is a puzzle for board-level maintenance and testing. Test methods based on boundary scan and digital I/O can not fulfill functional testing of entire circuit board. An automatic test system is constructed and a functional modeling method is put forward for FPGA circuit board testing. First, VITAL model is generated in FPGA development environment, achieving its functional modeling; then VITAL format configuration files and data are imported into LASAR, realizing circuit board simulation and fault simulation, and generating postprocessing documents; finally, postprocessing documents are input into ATE, and the automated testing and fault diagnosis of FPGA circuit board is implemented.\",\"PeriodicalId\":221663,\"journal\":{\"name\":\"International Conference on Electronic and Mechanical Engineering and Information Technology\",\"volume\":\"120 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Electronic and Mechanical Engineering and Information Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMEIT.2011.6023800\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Electronic and Mechanical Engineering and Information Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMEIT.2011.6023800","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design of test and diagnosis system for FPGA circuit board based on functional modeling
Circuit boards composed of the boundary scan and non-boundary scan devices exist widely, and the fault detection and isolation of these non-boundary scan circuit boards is a puzzle for board-level maintenance and testing. Test methods based on boundary scan and digital I/O can not fulfill functional testing of entire circuit board. An automatic test system is constructed and a functional modeling method is put forward for FPGA circuit board testing. First, VITAL model is generated in FPGA development environment, achieving its functional modeling; then VITAL format configuration files and data are imported into LASAR, realizing circuit board simulation and fault simulation, and generating postprocessing documents; finally, postprocessing documents are input into ATE, and the automated testing and fault diagnosis of FPGA circuit board is implemented.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信