Sanghyuck Han, Ikhwan Kim, Ju-Ik Oh, Hyo-Won Lee, Seong-Jin Kim, Jong-Won Yu
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引用次数: 0
摘要
本文介绍了在测量环境中，尽管衬底很薄，但仅使用两种不同的微带线即可获得介电常数和损耗切线。仅从理论上计算导体损耗和辐射损耗是不可能的。因此，本文采用三维电磁求解器CST Microwave Studio (MWS)计算导体损耗，忽略辐射损耗。因此，在本文中，介电常数的模拟和测量误差分别为0.53%和1.46%。
An Accurate and Simple Method for Measurement of RF Characterization in Thin Substrate
This paper presents that dielectric constant and loss tangent can be obtained using only two different microstrip lines in a measurement environment despite the thin substrate. It is impossible to calculate the conductor loss and radiation loss exactly only using theory. Therefore, in this paper, using 3-D electromagnetic solver CST Microwave Studio (MWS), the conductor loss was obtained and radiation loss was neglected. As result, in this paper, the dielectric constant has errors of 0.53% and 1.46%, in simulation and measurement each.
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