{"title":"内置采样时钟发生器的片上100ghz采样率8通道采样示波器","authors":"M. Takamiya, M. Mizuno, K. Nakamura","doi":"10.1109/ISSCC.2002.992996","DOIUrl":null,"url":null,"abstract":"An on-chip 8-channel sampling oscilloscope macro for signal integrity checking uses a 0.13 /spl mu/m CMOS process. It contains a phase-interpolated sampling clock generator for 100GHz sampling, charge-sharing sampling heads, and ESD-tolerant decoupling capacitors for noise-immune measurement.","PeriodicalId":423674,"journal":{"name":"2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"91","resultStr":"{\"title\":\"An on-chip 100 GHz-sampling rate 8-channel sampling oscilloscope with embedded sampling clock generator\",\"authors\":\"M. Takamiya, M. Mizuno, K. Nakamura\",\"doi\":\"10.1109/ISSCC.2002.992996\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An on-chip 8-channel sampling oscilloscope macro for signal integrity checking uses a 0.13 /spl mu/m CMOS process. It contains a phase-interpolated sampling clock generator for 100GHz sampling, charge-sharing sampling heads, and ESD-tolerant decoupling capacitors for noise-immune measurement.\",\"PeriodicalId\":423674,\"journal\":{\"name\":\"2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315)\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"91\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.2002.992996\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2002.992996","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An on-chip 100 GHz-sampling rate 8-channel sampling oscilloscope with embedded sampling clock generator
An on-chip 8-channel sampling oscilloscope macro for signal integrity checking uses a 0.13 /spl mu/m CMOS process. It contains a phase-interpolated sampling clock generator for 100GHz sampling, charge-sharing sampling heads, and ESD-tolerant decoupling capacitors for noise-immune measurement.