{"title":"基于窗口峰值功率模型的粒子群算法指导多频功耗感知的片上系统测试调度","authors":"R. Karmakar, Aditya Agarwal, S. Chattopadhyay","doi":"10.1109/ISVDAT.2014.6881089","DOIUrl":null,"url":null,"abstract":"This paper presents a multi-frequency test scheduling strategy for System-on-chip (SoC) under power constraint. While existing approaches consider either global peak or cycle-accurate power model, the proposed work considers an intermediate approach to reduce the power overestimation of global peak power model as well as the computational complexity of cycle-accurate power model. A Particle Swarm Optimization (PSO) guided test scheduling strategy has been integrated with our new window-based peak power model to reduce Test Application Time (TAT) over global peak power model. Experimental results show that further improvement in TAT can be achieved using multi-frequency test environment over single-frequency test approach.","PeriodicalId":217280,"journal":{"name":"18th International Symposium on VLSI Design and Test","volume":"106 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Particle Swarm Optimization guided multi-frequency power-aware System-on-Chip test scheduling using window-based peak power model\",\"authors\":\"R. Karmakar, Aditya Agarwal, S. Chattopadhyay\",\"doi\":\"10.1109/ISVDAT.2014.6881089\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a multi-frequency test scheduling strategy for System-on-chip (SoC) under power constraint. While existing approaches consider either global peak or cycle-accurate power model, the proposed work considers an intermediate approach to reduce the power overestimation of global peak power model as well as the computational complexity of cycle-accurate power model. A Particle Swarm Optimization (PSO) guided test scheduling strategy has been integrated with our new window-based peak power model to reduce Test Application Time (TAT) over global peak power model. Experimental results show that further improvement in TAT can be achieved using multi-frequency test environment over single-frequency test approach.\",\"PeriodicalId\":217280,\"journal\":{\"name\":\"18th International Symposium on VLSI Design and Test\",\"volume\":\"106 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-07-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"18th International Symposium on VLSI Design and Test\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISVDAT.2014.6881089\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"18th International Symposium on VLSI Design and Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISVDAT.2014.6881089","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Particle Swarm Optimization guided multi-frequency power-aware System-on-Chip test scheduling using window-based peak power model
This paper presents a multi-frequency test scheduling strategy for System-on-chip (SoC) under power constraint. While existing approaches consider either global peak or cycle-accurate power model, the proposed work considers an intermediate approach to reduce the power overestimation of global peak power model as well as the computational complexity of cycle-accurate power model. A Particle Swarm Optimization (PSO) guided test scheduling strategy has been integrated with our new window-based peak power model to reduce Test Application Time (TAT) over global peak power model. Experimental results show that further improvement in TAT can be achieved using multi-frequency test environment over single-frequency test approach.