手机产生的电磁干扰对GMR磁头和测试设备的影响

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Pub Date : 2000-09-26 DOI:10.1109/EOSESD.2000.890050

V. Kraz, A. Wallash

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引用次数: 18

摘要

在这项工作中，我们研究了电磁干扰(EMI)对GMR头和测试设备的影响。研究发现，三种类型的手机(AMPS, TDMA和CDMA)不会对GMR头造成磁性或电阻变化损坏，例如附近ESD事件造成的损坏。还发现，TDMA手机产生的EMI会导致旋转支架测试仪出现错误，从而中断测试过程，并在生产中造成良率损失。结论是，在处理和测试过程中，限制移动电话在GMR头附近的操作可能是谨慎的。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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The effects of EMI from cell phones on GMR magnetic recording heads and test equipment

In this work, we study the effects of electromagnetic interference (EMI) on GMR heads and test equipment. It was found that three types of cell phones (AMPS, TDMA and CDMA) did not cause magnetic or resistance change damage to the GMR heads, such as that caused by nearby ESD events. It was also found that EMI from a TDMA cell phone caused errors in a spin stand tester that could disrupt the test process and create yield losses in production. It is concluded that it may be prudent to restrict operation of mobile phones in the immediate proximity of GMR heads during handling and testing.

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Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)

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