线路电抗器线圈对线圈短路引起的电磁干扰效应

R. H. Potter
{"title":"线路电抗器线圈对线圈短路引起的电磁干扰效应","authors":"R. H. Potter","doi":"10.1109/RRCON.2002.1000110","DOIUrl":null,"url":null,"abstract":"The effect of coil-to-coil shorts on the impedance of line reactors has been an electromagnetic interference (EMI) safety issue for a number of years. This paper presents a comprehensive theoretical and experimental treatment of this issue. A circuit model was developed to evaluate the effects of coil-to-coil line reactor shorts. The circuit model was validated with experimental data. Potential failure mechanisms for coil-to-coil short circuits were developed and analyzed. Worst case values for potential shorts were established from experimental data. The system level effects for coil-to-coil short circuits were considered.","PeriodicalId":413474,"journal":{"name":"ASME/IEEE Joint Railroad Conference","volume":"77 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electromagnetic interference effects due to line reactor coil-to-coil short circuits\",\"authors\":\"R. H. Potter\",\"doi\":\"10.1109/RRCON.2002.1000110\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The effect of coil-to-coil shorts on the impedance of line reactors has been an electromagnetic interference (EMI) safety issue for a number of years. This paper presents a comprehensive theoretical and experimental treatment of this issue. A circuit model was developed to evaluate the effects of coil-to-coil line reactor shorts. The circuit model was validated with experimental data. Potential failure mechanisms for coil-to-coil short circuits were developed and analyzed. Worst case values for potential shorts were established from experimental data. The system level effects for coil-to-coil short circuits were considered.\",\"PeriodicalId\":413474,\"journal\":{\"name\":\"ASME/IEEE Joint Railroad Conference\",\"volume\":\"77 2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ASME/IEEE Joint Railroad Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RRCON.2002.1000110\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ASME/IEEE Joint Railroad Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RRCON.2002.1000110","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

多年来,线圈对线圈短路对线路电抗器阻抗的影响一直是一个电磁干扰(EMI)安全问题。本文对这一问题进行了全面的理论和实验处理。建立了一个电路模型来评估线圈对线圈线路电抗器短路的影响。用实验数据对电路模型进行了验证。提出并分析了线圈间短路的潜在失效机制。根据实验数据建立了潜在短路的最坏情况值。考虑了线圈间短路的系统级效应。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electromagnetic interference effects due to line reactor coil-to-coil short circuits
The effect of coil-to-coil shorts on the impedance of line reactors has been an electromagnetic interference (EMI) safety issue for a number of years. This paper presents a comprehensive theoretical and experimental treatment of this issue. A circuit model was developed to evaluate the effects of coil-to-coil line reactor shorts. The circuit model was validated with experimental data. Potential failure mechanisms for coil-to-coil short circuits were developed and analyzed. Worst case values for potential shorts were established from experimental data. The system level effects for coil-to-coil short circuits were considered.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信