A. Grishko
{"title":"电子系统参数可靠性预测的马尔可夫模型","authors":"A. Grishko","doi":"10.21685/2307-5538-2019-2-1","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":239916,"journal":{"name":"Measuring. Monitoring. Management. Control","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"MARKOV MODEL FOR PREDICTING THE PARAMETRIC RELIABILITY OF ELECTRONIC SYSTEMS\",\"authors\":\"A. Grishko\",\"doi\":\"10.21685/2307-5538-2019-2-1\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":239916,\"journal\":{\"name\":\"Measuring. Monitoring. Management. Control\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Measuring. Monitoring. Management. Control\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.21685/2307-5538-2019-2-1\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Measuring. Monitoring. Management. Control","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.21685/2307-5538-2019-2-1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1