{"title":"交流中断点对银基触点材料交流电弧侵蚀的影响","authors":"Hassan NOURI, T. Davies, J. Head","doi":"10.1109/HOLM.1998.722447","DOIUrl":null,"url":null,"abstract":"This paper presents experimental results obtained from a study into the reduction of contact erosion on break, using controlled AC point interruption principles. Five thousand break tests are carried out for a utilisation category of AC-1, at a current of 6 A rms, a gap-length of 2 mm on AgCdO (90%, 10%), AgCu3 (97%,3%) and Ag (fine, 99.9%) contacts, each with a diameter of 5 mm. The results show that by interrupting the circuit at selected points on the AC waveform, the rate of erosion varies significantly for different contact materials and the fine silver in general loses material. The minimum mass change for AgCdO is at interruption point /spl alpha/=135/spl deg/ and for AgCu3 surprisingly is at /spl alpha/=45/spl deg/. In the random break operation both AgCdO and fine Ag lose materials from both electrodes, but AgCu has an equal amount of material transfer. The paper also discusses the practical benefits of a controlled interruption technique within three-phase switching devices by incorporating a logic sequencer.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Influence of AC interruption points on AC arc erosion of silver based contact materials\",\"authors\":\"Hassan NOURI, T. Davies, J. Head\",\"doi\":\"10.1109/HOLM.1998.722447\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents experimental results obtained from a study into the reduction of contact erosion on break, using controlled AC point interruption principles. Five thousand break tests are carried out for a utilisation category of AC-1, at a current of 6 A rms, a gap-length of 2 mm on AgCdO (90%, 10%), AgCu3 (97%,3%) and Ag (fine, 99.9%) contacts, each with a diameter of 5 mm. The results show that by interrupting the circuit at selected points on the AC waveform, the rate of erosion varies significantly for different contact materials and the fine silver in general loses material. The minimum mass change for AgCdO is at interruption point /spl alpha/=135/spl deg/ and for AgCu3 surprisingly is at /spl alpha/=45/spl deg/. In the random break operation both AgCdO and fine Ag lose materials from both electrodes, but AgCu has an equal amount of material transfer. The paper also discusses the practical benefits of a controlled interruption technique within three-phase switching devices by incorporating a logic sequencer.\",\"PeriodicalId\":371014,\"journal\":{\"name\":\"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.1998.722447\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.1998.722447","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
摘要
本文介绍了采用可控交流断口原理减少断口接触侵蚀的实验结果。在6 a rms电流下,对AgCdO(90%, 10%)、AgCu3(97%,3%)和Ag(细,99.9%)触点的间隙长度为2mm的使用类别AC-1进行了5000次断开试验,每个触点的直径为5mm。结果表明,通过在交流波形上的选定点中断电路,不同触点材料的侵蚀率差异很大,细银通常会损失材料。AgCdO的最小质量变化是在中断点/spl alpha/=135/spl deg/, AgCu3的最小质量变化是在/spl alpha/=45/spl deg/。在随机断开操作中,AgCdO和细银都从两个电极上丢失材料,但AgCu具有等量的材料转移。本文还讨论了在三相开关器件中加入逻辑顺序器的控制中断技术的实际好处。
Influence of AC interruption points on AC arc erosion of silver based contact materials
This paper presents experimental results obtained from a study into the reduction of contact erosion on break, using controlled AC point interruption principles. Five thousand break tests are carried out for a utilisation category of AC-1, at a current of 6 A rms, a gap-length of 2 mm on AgCdO (90%, 10%), AgCu3 (97%,3%) and Ag (fine, 99.9%) contacts, each with a diameter of 5 mm. The results show that by interrupting the circuit at selected points on the AC waveform, the rate of erosion varies significantly for different contact materials and the fine silver in general loses material. The minimum mass change for AgCdO is at interruption point /spl alpha/=135/spl deg/ and for AgCu3 surprisingly is at /spl alpha/=45/spl deg/. In the random break operation both AgCdO and fine Ag lose materials from both electrodes, but AgCu has an equal amount of material transfer. The paper also discusses the practical benefits of a controlled interruption technique within three-phase switching devices by incorporating a logic sequencer.