新低10mΩ SiC mosfet in TO-247,额定电压为900V

V. Pala, Gangyao Wang, B. Hull, S. Allen, J. Casady, J. Palmour
{"title":"新低10mΩ SiC mosfet in TO-247,额定电压为900V","authors":"V. Pala, Gangyao Wang, B. Hull, S. Allen, J. Casady, J. Palmour","doi":"10.1109/APEC.2016.7467989","DOIUrl":null,"url":null,"abstract":"We demonstrate a 900V SiC MOSFET with a record-low ON resistance of 10 mΩ in a TO-247 package. Due to their record low specific ON resistance, and a low Rds,On temperature coefficient, 900V SiC MOSFETs can far exceed the current densities of IGBTs in discrete packages. SiC MOSFETs also have a robust, low reverse recovery body diode which makes them suited to hard-switched and soft-switched topologies with bi-directional conduction. They can also achieve superior light load efficiencies due to knee-less conduction in both 1st and 3rd quadrant, low switching losses and low body diode reverse recovery losses.","PeriodicalId":143091,"journal":{"name":"2016 IEEE Applied Power Electronics Conference and Exposition (APEC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2016-03-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Record-low 10mΩ SiC MOSFETs in TO-247, rated at 900V\",\"authors\":\"V. Pala, Gangyao Wang, B. Hull, S. Allen, J. Casady, J. Palmour\",\"doi\":\"10.1109/APEC.2016.7467989\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We demonstrate a 900V SiC MOSFET with a record-low ON resistance of 10 mΩ in a TO-247 package. Due to their record low specific ON resistance, and a low Rds,On temperature coefficient, 900V SiC MOSFETs can far exceed the current densities of IGBTs in discrete packages. SiC MOSFETs also have a robust, low reverse recovery body diode which makes them suited to hard-switched and soft-switched topologies with bi-directional conduction. They can also achieve superior light load efficiencies due to knee-less conduction in both 1st and 3rd quadrant, low switching losses and low body diode reverse recovery losses.\",\"PeriodicalId\":143091,\"journal\":{\"name\":\"2016 IEEE Applied Power Electronics Conference and Exposition (APEC)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-03-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Applied Power Electronics Conference and Exposition (APEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEC.2016.7467989\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Applied Power Electronics Conference and Exposition (APEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEC.2016.7467989","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16

摘要

我们在TO-247封装中展示了900V SiC MOSFET,其ON电阻为10 mΩ,创历史新低。由于其创纪录的低比导通电阻和低Rds、ON温度系数,900V SiC mosfet可以远远超过分立封装中igbt的电流密度。SiC mosfet还具有坚固,低反向恢复体二极管,这使得它们适合具有双向传导的硬开关和软开关拓扑结构。由于第一和第三象限的无膝传导,低开关损耗和低体二极管反向恢复损耗,它们还可以实现优越的轻负载效率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Record-low 10mΩ SiC MOSFETs in TO-247, rated at 900V
We demonstrate a 900V SiC MOSFET with a record-low ON resistance of 10 mΩ in a TO-247 package. Due to their record low specific ON resistance, and a low Rds,On temperature coefficient, 900V SiC MOSFETs can far exceed the current densities of IGBTs in discrete packages. SiC MOSFETs also have a robust, low reverse recovery body diode which makes them suited to hard-switched and soft-switched topologies with bi-directional conduction. They can also achieve superior light load efficiencies due to knee-less conduction in both 1st and 3rd quadrant, low switching losses and low body diode reverse recovery losses.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信