Sensitivity of Multipactor on Variations in SEY using a Continuum Vlasov-Poisson Model*

The impact of secondary electron yield (SEY) variations on multipactor in a parallel plate geometry is probed. In this contribution, electron swarm dynamics are simulated via the continuum approach across a variety of SEY curves. The objective is to determine which changes and shifts in the SEY curve are most sensitive to the final multipactor outcome. For instance, will a variation in the maximum SEY yield while retaining the first crossover energy produce significant changes in the MP susceptibility? To parameterize, the probed SEY curves are approximated by suitable square, triangular, or trapezoidal shapes and fed into the Vlasov-Poisson-based MP model to evaluate the impact of chosen energy-dependent deviations on multipactor. A shaped approximation of the SEY curve has already shown to produce signifigant changes in multipacotr susceptibility especially in the 1 st order regime. Variations in the 1 st and 2 nd crossover points of the SEY curve are also compared within the same susceptibility graphs. The results of this Vlasov-Poisson method are benchmarked against commercial software, particularly Spark3D. The results obtained and implications of SEY deviations on multipactor will be presented and discussed.