{"title":"安全关键型嵌入式应用软件可靠性演示试验方法","authors":"Zhidong Qin, Hui Chen, Youqun Shi","doi":"10.1109/ICESS.2008.76","DOIUrl":null,"url":null,"abstract":"In order to solve the problem that the fixed duration testing method, which based on the classical statistics, canpsilat satisfy the requirements of reliability testing for modern safety-critical embedded applications software due to the long testing duration, a hierarchical reliability demonstration approach was provided in this paper. The method unified architecture-based reliability modeling, maximum entropy principle and Bayesian inference. Numeral simulation shows that it is effective to reduce the testing duration without decreasing the confidence level for the testing results.","PeriodicalId":278372,"journal":{"name":"2008 International Conference on Embedded Software and Systems","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Reliability Demonstration Testing Method for Safety-Critical Embedded Applications Software\",\"authors\":\"Zhidong Qin, Hui Chen, Youqun Shi\",\"doi\":\"10.1109/ICESS.2008.76\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to solve the problem that the fixed duration testing method, which based on the classical statistics, canpsilat satisfy the requirements of reliability testing for modern safety-critical embedded applications software due to the long testing duration, a hierarchical reliability demonstration approach was provided in this paper. The method unified architecture-based reliability modeling, maximum entropy principle and Bayesian inference. Numeral simulation shows that it is effective to reduce the testing duration without decreasing the confidence level for the testing results.\",\"PeriodicalId\":278372,\"journal\":{\"name\":\"2008 International Conference on Embedded Software and Systems\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-07-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Conference on Embedded Software and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICESS.2008.76\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Embedded Software and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICESS.2008.76","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability Demonstration Testing Method for Safety-Critical Embedded Applications Software
In order to solve the problem that the fixed duration testing method, which based on the classical statistics, canpsilat satisfy the requirements of reliability testing for modern safety-critical embedded applications software due to the long testing duration, a hierarchical reliability demonstration approach was provided in this paper. The method unified architecture-based reliability modeling, maximum entropy principle and Bayesian inference. Numeral simulation shows that it is effective to reduce the testing duration without decreasing the confidence level for the testing results.