可编程芯片上硬化系统的恢复方案

C. Meinhardt, R. Reis, M. Violante, M. Reorda
{"title":"可编程芯片上硬化系统的恢复方案","authors":"C. Meinhardt, R. Reis, M. Violante, M. Reorda","doi":"10.1109/LATW.2009.4813816","DOIUrl":null,"url":null,"abstract":"The checkpoint and rollback recovery techniques enable a system to survive failures by periodically saving a known good snapshot of the system's state, and rolling back to it in case a failure is detected. The approach is particularly interesting for developing critical systems on programmable chips that today offers multiple embedded processor cores, as well as configurable fabric that can be used to implement error detection and correction mechanisms. This paper presents an approach that aims at developing a safety- or mission-critical systems on programmable chip able to tolerate soft errors by exploiting processor duplication to implement error detection, as well as checkpoint and rollback recovery to correct errors in a cost-efficient manner. We developed a prototypical implementation of the proposed approach targeting the Leon processor core, and we collected preliminary results that outline the capability of the technique to tolerate soft errors affecting the processor's internal registers. This paper is the first step toward the definition of an automatic design flow for hardening processor cores (either hard of soft) embedded in programmable chips, like for example SRAM-based FPGAs.","PeriodicalId":343240,"journal":{"name":"2009 10th Latin American Test Workshop","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-03-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Recovery scheme for hardening system on programmable chips\",\"authors\":\"C. Meinhardt, R. Reis, M. Violante, M. Reorda\",\"doi\":\"10.1109/LATW.2009.4813816\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The checkpoint and rollback recovery techniques enable a system to survive failures by periodically saving a known good snapshot of the system's state, and rolling back to it in case a failure is detected. The approach is particularly interesting for developing critical systems on programmable chips that today offers multiple embedded processor cores, as well as configurable fabric that can be used to implement error detection and correction mechanisms. This paper presents an approach that aims at developing a safety- or mission-critical systems on programmable chip able to tolerate soft errors by exploiting processor duplication to implement error detection, as well as checkpoint and rollback recovery to correct errors in a cost-efficient manner. We developed a prototypical implementation of the proposed approach targeting the Leon processor core, and we collected preliminary results that outline the capability of the technique to tolerate soft errors affecting the processor's internal registers. This paper is the first step toward the definition of an automatic design flow for hardening processor cores (either hard of soft) embedded in programmable chips, like for example SRAM-based FPGAs.\",\"PeriodicalId\":343240,\"journal\":{\"name\":\"2009 10th Latin American Test Workshop\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-03-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 10th Latin American Test Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LATW.2009.4813816\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 10th Latin American Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATW.2009.4813816","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

检查点和回滚恢复技术通过定期保存系统状态的已知良好快照,并在检测到故障时回滚到该快照,使系统能够在故障中存活下来。这种方法对于在可编程芯片上开发关键系统特别有趣,这些芯片目前提供多个嵌入式处理器内核,以及可用于实现错误检测和纠正机制的可配置结构。本文提出了一种方法,旨在开发一种安全或关键任务系统在可编程芯片上能够容忍软错误,通过利用处理器复制来实现错误检测,以及检查点和回滚恢复,以一种经济有效的方式纠正错误。我们开发了针对Leon处理器核心的建议方法的原型实现,并收集了初步结果,概述了该技术容忍影响处理器内部寄存器的软错误的能力。本文是定义嵌入可编程芯片(例如基于sram的fpga)的硬化处理器内核(无论是硬的还是软的)的自动设计流程的第一步。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Recovery scheme for hardening system on programmable chips
The checkpoint and rollback recovery techniques enable a system to survive failures by periodically saving a known good snapshot of the system's state, and rolling back to it in case a failure is detected. The approach is particularly interesting for developing critical systems on programmable chips that today offers multiple embedded processor cores, as well as configurable fabric that can be used to implement error detection and correction mechanisms. This paper presents an approach that aims at developing a safety- or mission-critical systems on programmable chip able to tolerate soft errors by exploiting processor duplication to implement error detection, as well as checkpoint and rollback recovery to correct errors in a cost-efficient manner. We developed a prototypical implementation of the proposed approach targeting the Leon processor core, and we collected preliminary results that outline the capability of the technique to tolerate soft errors affecting the processor's internal registers. This paper is the first step toward the definition of an automatic design flow for hardening processor cores (either hard of soft) embedded in programmable chips, like for example SRAM-based FPGAs.
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