功率半导体器件:提高现场可靠性的设计和制造(诚邀)

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) Pub Date : 2002-08-07 DOI:10.1109/ICCDCS.2002.1004104

K. Shenai

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引用次数: 0

摘要

在信息时代，电力电子系统需要验证现场可靠性的“9个9”。目前大多数电源转换器的可靠性性能充其量是在“6个9”的范围内。为了成功地满足新兴市场的需求，需要大幅提高设备的稳健性。在本文中，我们讨论了一种新的“自上而下”的系统级方法来识别和纠正紧凑型高频计算机和电信电源中的过量现场故障。我们概述了设计和制造保证“内置”现场可靠性的强大功率半导体开关的方法。

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Power semiconductor devices: design and manufacturing for improved field reliability (invited)

In the information age, power electronic systems need to demonstrate, "nine 9's" of field reliability. The current reliability performance of most power converters is at best is in the range of "six 9's." A dramatic improvement in device robustness is needed to successfully address the emerging market demand. In this paper, we discuss a new "top-down" system-level approach to identify and correct excessive field failures in compact high-frequency computer and telecom power supplies. We outline approaches to design and manufacture robust power semiconductor switches that guarantee "built-in" field reliability.

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Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)

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